Imaging Plate Absolute Calibration in the XUV Wavelength Range

2020 ◽  
pp. 103-106
Author(s):  
P. Gajdoš ◽  
M. Kozlová ◽  
M. Krůs
Keyword(s):  
Wavelength Range ◽  
Absolute Calibration ◽  
Imaging Plate

scholarly journals Absolute calibration of imaging plate for GeV electrons

2008 ◽  
Vol 79 (6) ◽  
pp. 066102 ◽  
Author(s):  
N. Nakanii ◽  
K. Kondo ◽  
T. Yabuuchi ◽  
K. Tsuji ◽  
K. A. Tanaka ◽  
...  
Keyword(s):  
Absolute Calibration ◽  
Imaging Plate

Absolute calibration of imaging plate detectors for electron kinetic energies between 150 keV and 1.75 MeV

2017 ◽  
Vol 88 (7) ◽  
pp. 075105 ◽  
Author(s):  
S. Singh ◽  
T. Slavicek ◽  
R. Hodak ◽  
R. Versaci ◽  
P. Pridal ◽  
...  
Keyword(s):  
Absolute Calibration ◽  
Imaging Plate

Absolute calibration of a time-of-flight spectrometer and imaging plate for the characterization of laser-accelerated protons

2009 ◽  
Vol 20 (11) ◽  
pp. 115112 ◽  
Author(s):  
I W Choi ◽  
C M Kim ◽  
J H Sung ◽  
I J Kim ◽  
T J Yu ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Absolute Calibration ◽  
Imaging Plate ◽  
Accelerated Protons

scholarly journals Absolute calibration of imaging plate for electron spectrometer measuring GeV-class electrons

2008 ◽  
Vol 112 (3) ◽  
pp. 032073 ◽  
Author(s):  
N Nakanii ◽  
K Kondo ◽  
S Suzuki ◽  
T Kobayashi ◽  
T Asaka ◽  
...  
Keyword(s):  
Absolute Calibration ◽  
Imaging Plate ◽  
Electron Spectrometer

Evaluation method for imaging plate resolution by means of phase contrast transfer function

1995 ◽  
Vol 53 ◽  
pp. 662-663 ◽  
Author(s):  
T. Oikawa ◽  
H. Kosugi ◽  
F. Hosokawa ◽  
D. Shindo ◽  
M. Kersker
Keyword(s):  
Transfer Function ◽  
Phase Contrast ◽  
Evaluation Method ◽  
Amorphous Film ◽  
Imaging Plate ◽  
X Rays ◽  
Special Shape ◽  
Contrast Transfer Function ◽  
Contrast Image ◽  
Specimen Shape

Evaluation of the resolution of the Imaging Plate (IP) has been attempted by some methods. An evaluation method for IP resolution, which is not influenced by hard X-rays at higher accelerating voltages, was proposed previously by the present authors. This method, however, requires truoblesome experimental preperations partly because specially synthesized hematite was used as a specimen, and partly because a special shape of the specimen was used as a standard image. In this paper, a convenient evaluation method which is not infuenced by the specimen shape and image direction, is newly proposed. In this method, phase contrast images of thin amorphous film are used.Several diffraction rings are obtained by the Fourier transformation of a phase contrast image of thin amorphous film, taken at a large under focus. The rings show the spatial-frequency spectrum corresponding to the phase contrast transfer function (PCTF). The envelope function is obtained by connecting the peak intensities of the rings. The evelope function is offten used for evaluation of the instrument, because the function shows the performance of the electron microscope (EM).

Estimation of the noise in TEM image recorded on “imaging plate”

1987 ◽  
Vol 45 ◽  
pp. 748-749
Author(s):  
T. Oikawa ◽  
N. Mori ◽  
T. Katoh ◽  
Y. Harada ◽  
J. Miyahara ◽  
...  
Keyword(s):  
Low Dose ◽  
Quantum Noise ◽  
Laser Light ◽  
Imaging Plate ◽  
Total System ◽  
Electron Dose ◽  
X Ray ◽  
Image Recording ◽  
Recording Material ◽  
Highly Sensitive

The “Imaging Plate”(IP) is a highly sensitive image recording plate for X-ray radiography. It has been ascertained that the IP has superior properties and high practicability as an image recording material in a TEM. The sensitivity, one of the properties, is about 3 orders higher than that of conventional photo film. The IP is expected to be applied to low dose techniques. In this paper, an estimation of the quantum noise on the TEM image which appears in case of low electron dose on the IP is reported.In this experiment, the JEM-2000FX TEM and an IP having the same size as photo film were used.Figure 1 shows the schematic diagram of the total system including the TEM used in this experiment. In the reader, He-Ne laser light is scanned across the IP, then blue light is emitted from the IP.

Development of imaging plate for a TEM and its characteristics

1989 ◽  
Vol 47 ◽  
pp. 100-101
Author(s):  
N. Mori ◽  
T. Oikawa ◽  
Y. Harada ◽  
J. Miyahara ◽  
T. Matsuo
Keyword(s):  
Dynamic Range ◽  
Protective Layer ◽  
High Sensitivity ◽  
Imaging Plate ◽  
Phosphor Layer ◽  
Imaging Device ◽  
X Ray Imaging ◽  
New Type ◽  
Basic Characteristics ◽  
Reading System

The Imaging Plate (IP) is a new type imaging device, which was developed for diagnostic x ray imaging. We have reported that usage of the IP for a TEM has many merits; those are high sensitivity, wide dynamic range, and good linearity. However in the previous report the reading system was prototype drum-type-scanner, and IP was also experimentally made, which phosphor layer was 50μm thick with no protective layer. So special care was needed to handle them, and they were used only to make sure the basic characteristics. In this article we report the result of newly developed reading, printing system and high resolution IP for practical use. We mainly discuss the characteristics of the IP here. (Precise performance concerned with the reader and other system are reported in the other article.)Fig.1 shows the schematic cross section of the IP. The IP consists of three parts; protective layer, phosphor layer and support.

Quantitative Electron Microscope with imaging plate

1994 ◽  
Vol 52 ◽  
pp. 408-409
Author(s):  
D. Shindo
Keyword(s):  
Electron Microscope ◽  
Dynamic Range ◽  
Processing System ◽  
Digital Data ◽  
Imaging Plate ◽  
Crystal Thickness ◽  
X Ray Diffraction ◽  
Resolution Electron ◽  
Electron Intensity ◽  
Diffraction Patterns

Imaging plate has good properties, i.e., a wide dynamic range and good linearity for the electron intensity. Thus the digital data (2048x1536 pixels, 4096 gray levels in log scale) obtained with the imaging plate can be used for quantification in electron microscopy. By using the image processing system (PIXsysTEM) combined with a main frame (ACOS3900), quantitative analysis of electron diffraction patterns and high-resolution electron microscope (HREM) images has been successfully carried out.In the analysis of HREM images observed with the imaging plate, quantitative comparison between observed intensity and calculated intensity can be carried out by taking into account the experimental parameters such as crystal thickness and defocus value. An example of HREM images of quenched Tl2Ba2Cu1Oy (Tc = 70K) observed with the imaging plate is shown in Figs. 1(b) - (d) comparing with a structure model proposed by x-ray diffraction study of Fig. 1 (a). The image was observed with a JEM-4000EX electron microscope (Cs =1.0 mm).

Application of Imaging Plate to High-Voltage Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 168-169
Author(s):  
Seiji Isoda ◽  
Kimitsugu Saitoh ◽  
Sakumi Moriguchi ◽  
Takashi Kobayashi
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
High Sensitivity ◽  
Imaging Plate ◽  
High Quality ◽  
Electron Dose ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Recording Material

On the observation of structures by high resolution electron microscopy, recording materials with high sensitivity and high quality is awaited, especially for the study of radiation sensitive specimens. Such recording material should be easily combined with the minimum dose system and cryoprotection method. Recently a new recording material, imaging plate, comes to be widely used in X-ray radiography and also in electron microscopy, because of its high sensitivity, high quality and the easiness in handling the images with a computer. The properties of the imaging plate in 100 to 400 kV electron microscopes were already discussed and the effectiveness was revealed.It is demanded to study the applicability of the imaging plate to high voltage electron microscopy. The quality of the imaging plate was investigated using an imaging plate system (JEOL EM-HSR100) equipped in a new Kyoto 1000kV electron microscope. In the system both the imaging plate and films can be introduced together into the camera chamber. Figure 1 shows the effect of accelerating voltage on read-out signal intensities from the imaging plate. The characteristic of commercially available imaging plates is unfortunately optimized for 100 to 200 keV electrons and then for 600 to 1000 keV electrons the signal is reduced. In the electron dose range of 10−13 to 10−10 C/cm2, the signal increases linearly with logarithm of electron dose in all acceralating volatges.

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