Combining Scanning Probe Microscopy and Transmission Electron Microscopy

Author(s):  
Alexandra Nafari ◽  
Johan Angenete ◽  
Krister Svensson ◽  
Anke Sanz-Velasco ◽  
Håkan Olin
2015 ◽  
Vol 3 (16) ◽  
pp. 8706-8714 ◽  
Author(s):  
Alexander Alekseev ◽  
Gordon J. Hedley ◽  
Alaa Al-Afeef ◽  
Oleg A. Ageev ◽  
Ifor D. W. Samuel

The detailed structure of PTB7:PC71BM blends deposited with and without addition of diiodooctane studied by transmission electron microscopy and scanning probe microscopy.


2012 ◽  
Vol 20 (5) ◽  
pp. 46-51

Microscopy Today congratulates the third annual group of Innovation Award winners. The ten innovations described below move several microscopy techniques forward: atomic force microscopy, transmission electron microscopy, light microscopy, scanning probe microscopy, electron microscopy, and analytical microscopy. These innovations will make imaging and analysis more powerful, more flexible, more productive, and easier to accomplish.


2013 ◽  
Vol 21 (5) ◽  
pp. 40-45

Microscopy Today congratulates the fourth annual group of Innovation Award winners. The ten innovations described below move several microscopy techniques forward: light microscopy, scanning probe microscopy, electron microscopy, ion microscopy, and hybrid microscopy-analysis methods. These innovations will make imaging and analysis more powerful, more flexible, more productive, and easier to accomplish.


Sign in / Sign up

Export Citation Format

Share Document