Angle-resolved tunneling spectroscopy of Si conduction band using bonded Si(111) wafer pair

Author(s):  
A. Kazama ◽  
H. Bando ◽  
Y. Miyahara ◽  
H. Enomoto ◽  
H. Ozaki
2000 ◽  
Vol 618 ◽  
Author(s):  
Xiangdong Chen ◽  
Xiang-Dong Wang ◽  
Kou-Chen Liu ◽  
Dong-Won Kim ◽  
Sanjay Banerjee

ABSTRACTThe band offsets and band gap are the most important parameters that determine the electrical and optical behavior of a heterojunction. In situscanning tunneling spectroscopy (STS) was employed to measure the valence band offset of strained Si1−xGex-on-Si (100) for the first time. The valence band offsets of strained Si0.77Ge0.23and Si0.59Ge0.41on Si(100) are found to be 0.21eV and 0.36eV, respectively. The results are in good agreement with theory and with results from other experimental methods. Due to band bending and surface states, it is difficult to determine the conduction band edge at the interface of Si1−xGex/Si exactly, but the conduction band offset is found to be much smaller than the valence band offset


2007 ◽  
Vol 1035 ◽  
Author(s):  
Takashi Tamura ◽  
Changman Kim ◽  
Yasushi Oikawa ◽  
Hajime Ozaki

AbstractThe first observations have been made on the electronic density of states of Mn, Co and Fe-doped ZnO by tunneling spectroscopy. For Mn- and Co-doped ZnO, rising of DOS were observed around 2.8eV and 3.2eV below the bottom of the conduction band, respectively. In these cases, the Fermi level lay at the bottom of the conduction band. For Fe-doped ZnO, the DOS with about 1.2eV width was observed around the Fermi level in the mid-gap. The result reproduced the recent theoretical calculation.


2000 ◽  
Vol 15 (6) ◽  
pp. 1257-1260 ◽  
Author(s):  
Xiangdong Chen ◽  
Xiang-Dong Wang ◽  
Kou-Chen Liu ◽  
Dong-Won Kim ◽  
Sanjay Banerjee

The band offsets and band gap are the most important parameters that determine the electrical and optical behavior of a heterojunction. In situ scanning tunneling spectroscopy was employed to measure the valence-band offset of strained Si1−xGex-on-Si (100) for the first time. The valence-band offsets of the strained Si0.77Ge0.23 and Si0.59Ge0.41 on Si(100) were found to be 0.21 and 0.36 eV, respectively. The results were in good agreement with theory and with results from other experimental methods. Due to band bending and surface states, it was difficult to determine the conduction band edge at the interface of the Si1−xGex/Si exactly but we found that the conduction band offset is much smaller than the valence-band offset.


2004 ◽  
Vol 114 ◽  
pp. 135-136 ◽  
Author(s):  
E. Slot ◽  
K. O'Neill ◽  
H. S.J. van der Zant ◽  
R. E. Thorne

2001 ◽  
Vol 171 (12) ◽  
pp. 1368
Author(s):  
V.A. Volkov ◽  
E.E. Takhtamirov ◽  
D.Yu. Ivanov ◽  
Yu.V. Dubrovskii ◽  
L. Eaves ◽  
...  

2003 ◽  
Vol 771 ◽  
Author(s):  
M. Kemerink ◽  
S.F. Alvarado ◽  
P.M. Koenraad ◽  
R.A.J. Janssen ◽  
H.W.M. Salemink ◽  
...  

AbstractScanning-tunneling spectroscopy experiments have been performed on conjugated polymer films and have been compared to a three-dimensional numerical model for charge injection and transport. It is found that field enhancement near the tip apex leads to significant changes in the injected current, which can amount to more than an order of magnitude, and can even change the polarity of the dominant charge carrier. As a direct consequence, the single-particle band gap and band alignment of the organic material can be directly obtained from tip height-voltage (z-V) curves, provided that the tip has a sufficiently sharp apex.


Sign in / Sign up

Export Citation Format

Share Document