Optimal Computer Control for Digital Processes with Incomplete State Feedback

1974 ◽  
pp. 54-65 ◽  
Author(s):  
A. Y. Bilal ◽  
M. A. El-Said ◽  
M. M. Fahmy
Keyword(s):  
State Feedback ◽  
Computer Control ◽  
Digital Processes

Stable Computer Control Algorithm of Von Neumann Model

2013 ◽  
Vol 634-638 ◽  
pp. 4026-4029
Author(s):  
Xiu Mei Wu ◽  
Tao Zi Si ◽  
Lei Jiang
Keyword(s):  
Control Algorithm ◽  
State Feedback ◽  
Singular Systems ◽  
Computer Control ◽  
Linear Matrix ◽  
Input Output ◽  
Von Neumann ◽  
General Systems ◽  
Feedback Stability ◽  
Neumann Model

The problem of computer control algorithm for the singular Von Neumann input-output model is researched. A kind of new mathematic method is applied to study the singular systems without converting them into general systems. A kind of stability condition under which the singular input-output model is admissible is proved with the form of linear matrix inequality. Based on this, a new state feedback stability criterion is established. Then the formula of a desired state feedback controller is derived.

Microdensitometer—computer correlation analysis of ultrastructural periodicity

1978 ◽  
Vol 36 (2) ◽  
pp. 32-33
Author(s):  
D.R. Ensor ◽  
C.G. Jensen ◽  
J.A. Fillery ◽  
R.J.K. Baker
Keyword(s):  
Correlation Analysis ◽  
Background Noise ◽  
Computer Control ◽  
Optical Diffraction ◽  
Screw Thread ◽  
Straight Line ◽  
Computer Storage ◽  
Correlation Process ◽  
Electron Microscope Image ◽  
Fixed Beam

Because periodicity is a major indicator of structural organisation numerous methods have been devised to demonstrate periodicity masked by background “noise” in the electron microscope image (e.g. photographic image reinforcement, Markham et al, 1964; optical diffraction techniques, Horne, 1977; McIntosh,1974). Computer correlation analysis of a densitometer tracing provides another means of minimising "noise". The correlation process uncovers periodic information by cancelling random elements. The technique is easily executed, the results are readily interpreted and the computer removes tedium, lends accuracy and assists in impartiality.A scanning densitometer was adapted to allow computer control of the scan and to give direct computer storage of the data. A photographic transparency of the image to be scanned is mounted on a stage coupled directly to an accurate screw thread driven by a stepping motor. The stage is moved so that the fixed beam of the densitometer (which is directed normal to the transparency) traces a straight line along the structure of interest in the image.

Defocus ramp correction in spot-scan imaging

1992 ◽  
Vol 50 (1) ◽  
pp. 130-131
Author(s):  
Kenneth H. Downing
Keyword(s):  
Computer Control ◽  
Three Dimensional ◽  
Sufficient Accuracy ◽  
Objective Lens ◽  
Electron Crystallography ◽  
Contrast Transfer Function ◽  
Tilt Axis ◽  
Specimen Height ◽  
The Difference ◽  
Envelope Functions

Three-dimensional structures of a number of samples have been determined by electron crystallography. The procedures used in this work include recording images of fairly large areas of a specimen at high tilt angles. There is then a large defocus ramp across the image, and parts of the image are far out of focus. In the regions where the defocus is large, the contrast transfer function (CTF) varies rapidly across the image, especially at high resolution. Not only is the CTF then difficult to determine with sufficient accuracy to correct properly, but the image contrast is reduced by envelope functions which tend toward a low value at high defocus.We have combined computer control of the electron microscope with spot-scan imaging in order to eliminate most of the defocus ramp and its effects in the images of tilted specimens. In recording the spot-scan image, the beam is scanned along rows that are parallel to the tilt axis, so that along each row of spots the focus is constant. Between scan rows, the objective lens current is changed to correct for the difference in specimen height from one scan to the next.

Applications of CCEM to Environmental Health Problems

1985 ◽  
Vol 43 ◽  
pp. 102-103
Author(s):  
R. J. Lee ◽  
J. S. Walker
Keyword(s):  
Electron Microscopy ◽  
Image Analysis ◽  
Environmental Health ◽  
Computer Control ◽  
External Agent ◽  
External Agents ◽  
Computer Controlled ◽  
Primitive State ◽  
Textural Changes ◽  
General Aspects

Electron microscopy (EM), with the advent of computer control and image analysis techniques, is rapidly evolving from an interpretative science into a quantitative technique. Electron microscopy is potentially of value in two general aspects of environmental health: exposure and diagnosis.In diagnosis, electron microscopy is essentially an extension of optical microscopy. The goal is to characterize cellular changes induced by external agents. The external agent could be any foreign material, chemicals, or even stress. The use of electron microscopy as a diagnostic tool is well- developed, but computer-controlled electron microscopy (CCEM) has had only limited impact, mainly because it is fairly new and many institutions lack the resources to acquire the capability. In addition, major contributions to diagnosis will come from CCEM only when image analysis (IA) and processing algorithms are developed which allow the morphological and textural changes recognized by experienced medical practioners to be quantified. The application of IA techniques to compare cellular structure is still in a primitive state.

The Instructional SEM Laboratory at Iowa State University

1996 ◽  
Vol 54 ◽  
pp. 396-397
Author(s):  
L. S. Chumbley ◽  
M. Meyer ◽  
K. Fredrickson ◽  
F.C. Laabs
Keyword(s):  
Materials Science ◽  
Computer Network ◽  
Energy Dispersive Spectrometer ◽  
Computer Control ◽  
State University ◽  
Iowa State University ◽  
Internet Server ◽  
Schematic Layout ◽  
Hands On ◽  
Improve Instruction

The Materials Science Department at Iowa State University has developed a laboratory designed to improve instruction in the use of the scanning electron microscope (SEM). The laboratory makes use of a computer network and a series of remote workstations in a classroom setting to provide students with increased hands-on access to the SEM. The laboratory has also been equipped such that distance learning via the internet can be achieved.A view of the laboratory is shown in Figure 1. The laboratory consists of a JEOL 6100 SEM, a Macintosh Quadra computer that acts as a server for the network and controls the energy dispersive spectrometer (EDS), four Macintosh computers that act as remote workstations, and a fifth Macintosh that acts as an internet server. A schematic layout of the classroom is shown in Figure 2. The workstations are connected directly to the SEM to allow joystick and computer control of the microscope. An ethernet connection between the Quadra and the workstations allows students seated there to operate the EDS. Control of the microscope and joystick is passed between the workstations by a switch-box assembly that resides at the microscope console. When the switch-box assembly is activated a direct serial line is established between the specified workstation and the microscope via the SEM’s RS-232.

A computer-control program for TEM in situ fatigue experiments

1989 ◽  
Vol 47 ◽  
pp. 620-621
Author(s):  
Kenneth S. Vecchio ◽  
John A. Hunt
Keyword(s):  
Slow Crack Growth ◽  
Computer Control ◽  
Control Program ◽  
Video Tape ◽  
Computer Control System ◽  
Transmission Electron ◽  
In Situ Experiments ◽  
Tremendous Amount ◽  
And Control

In-situ experiments conducted within a transmission electron microscope provide the operator a unique opportunity to directly observe microstructural phenomena, such as phase transformations and dislocation-precipitate interactions, “as they happen”. However, in-situ experiments usually require a tremendous amount of experimental preparation beforehand, as well as, during the actual experiment. In most cases the researcher must operate and control several pieces of equipment simultaneously. For example, in in-situ deformation experiments, the researcher may have to not only operate the TEM, but also control the straining holder and possibly some recording system such as a video tape machine. When it comes to in-situ fatigue deformation, the experiments became even more complicated with having to control numerous loading cycles while following the slow crack growth. In this paper we will describe a new method for conducting in-situ fatigue experiments using a camputer-controlled tensile straining holder.The tensile straining holder used with computer-control system was manufactured by Philips for the Philips 300 series microscopes. It was necessary to modify the specimen stage area of this holder to work in the Philips 400 series microscopes because the distance between the optic axis and holder airlock is different than in the Philips 300 series microscopes. However, the program and interfacing can easily be modified to work with any goniometer type straining holder which uses a penrmanent magnet motor.

The new CM-Series TEMs: integration of a five-axis motorized, fully computer-controlled goniometer

1993 ◽  
Vol 51 ◽  
pp. 258-259
Author(s):  
Marc J.C. de Jong ◽  
P. Emile S.J. Asselbergs ◽  
Max T. Otten
Keyword(s):  
Mechanical Design ◽  
Computer Control ◽  
Objective Lens ◽  
Access Port ◽  
Vibration Stability ◽  
Transmission Electron ◽  
Computer Controlled ◽  
High Degree ◽  
Five Axis ◽  
Five Axes

A new step forward in Transmission Electron Microscopy has been made with the introduction of the CompuStage on the CM-series TEMs: CM120, CM200, CM200 FEG and CM300. This new goniometer has motorization on five axes (X, Y, Z, α, β), all under full computer control by a dedicated microprocessor that is in communication with the main CM processor. Positions on all five axes are read out directly - not via a system counting motor revolutions - thereby providing a high degree of accuracy. The CompuStage enters the octagonal block around the specimen through a single port, allowing the specimen stage to float freely in the vacuum between the objective-lens pole pieces, thereby improving vibration stability and freeing up one access port. Improvements in the mechanical design ensure higher stability with regard to vibration and drift. During stage movement the holder O-ring no longer slides, providing higher drift stability and positioning accuracy as well as better vacuum.

A Macintosh Interface for the Cameca Camebax-Micro Electron Microprobe

1990 ◽  
Vol 48 (1) ◽  
pp. 438-439
Author(s):  
Carl E. Henderson
Keyword(s):  
Electron Microprobe ◽  
Processing Speed ◽  
Word Processing ◽  
State Of The Art ◽  
Computer Control ◽  
Third Party ◽  
Disk Storage ◽  
The Past ◽  
User Facility ◽  
Instrument Control

Over the past few years it has become apparent in our multi-user facility that the computer system and software supplied in 1985 with our CAMECA CAMEBAX-MICRO electron microprobe analyzer has the greatest potential for improvement and updating of any component of the instrument. While the standard CAMECA software running on a DEC PDP-11/23+ computer under the RSX-11M operating system can perform almost any task required of the instrument, the commands are not always intuitive and can be difficult to remember for the casual user (of which our laboratory has many). Given the widespread and growing use of other microcomputers (such as PC’s and Macintoshes) by users of the microprobe, the PDP has become the “oddball” and has also fallen behind the state-of-the-art in terms of processing speed and disk storage capabilities. Upgrade paths within products available from DEC are considered to be too expensive for the benefits received. After using a Macintosh for other tasks in the laboratory, such as instrument use and billing records, word processing, and graphics display, its unique and “friendly” user interface suggested an easier-to-use system for computer control of the electron microprobe automation. Specifically a Macintosh IIx was chosen for its capacity for third-party add-on cards used in instrument control.

Pilot study may give quadriplegics computer control

Nature ◽  
2003 ◽  
Author(s):  
Helen R. Pilcher
Keyword(s):  
Pilot Study ◽  
Computer Control
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