Multiple-output logic element based on an optical interference system

1985 ◽  
Vol 17 (2) ◽  
pp. 119-123 ◽  
Author(s):  
Y. Imai ◽  
Y. Ohtsuka ◽  
K. Tanaka
2004 ◽  
Vol 61 (1/2) ◽  
pp. 37-41 ◽  
Author(s):  
M. A. Novikov ◽  
A. D. Tertyshnik ◽  
V. V. Ivanov ◽  
V. A. Markelov ◽  
A. V. Goryunov ◽  
...  

1964 ◽  
Vol 27 (4) ◽  
pp. 293 ◽  
Author(s):  
W.D. Ryan ◽  
H.B. Williams
Keyword(s):  

2014 ◽  
Vol 8 (4) ◽  
pp. 231-241 ◽  
Author(s):  
Peter Lehmann ◽  
Jan Niehues ◽  
Stanislav Tereschenko

1997 ◽  
Vol 33 (20) ◽  
pp. 1733 ◽  
Author(s):  
K. Maezawa ◽  
H. Matsuzaki ◽  
K. Arai ◽  
T. Otsuji ◽  
M. Yamamoto

1973 ◽  
Vol 20 (12) ◽  
pp. 925-937 ◽  
Author(s):  
J.A. Dobrowolski ◽  
K.M. Baird ◽  
P.D. Carman ◽  
A. Waldorf
Keyword(s):  

2014 ◽  
Vol 494-495 ◽  
pp. 1274-1277
Author(s):  
Kan Liu ◽  
Hao You

This article introduces a measurement system based on LabVIEW used for optical interference fringe on micro-fluidic chips. This system mainly uses cameras to capture real-time images of wedge interference fringe on micro-fluidic chips, then the collected images will be binarized by LabVIEW. The processed images will be divided by zone , determine the flatness and gap thickness of the micro-fluidic chips by interference fringes with different directions of deflection and numbers. Finally, feedback from measured data will be used to adjust the flatness and gap thickness of micro-fluidic chips in order to meet the requirement of tests.


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