Electron trapping center and SnO2-doping mechanism of indium tin oxide

2000 ◽  
Vol 71 (6) ◽  
pp. 609-614 ◽  
Author(s):  
T. Omata ◽  
H. Fujiwara ◽  
S. Otsuka-Yao-Matsuo ◽  
N. Ono

1986 ◽  
Vol 59 (10) ◽  
pp. 3489-3494 ◽  
Author(s):  
S. Nojima ◽  
H. Tanaka ◽  
H. Asahi


2007 ◽  
Author(s):  
Chang Bum Park ◽  
Takamichi Yokoyama ◽  
Tomonori Nishimura ◽  
Koji Kita ◽  
Akira Toriumi


1992 ◽  
Vol 280 ◽  
Author(s):  
H. Taniguchi ◽  
T. Ushiro ◽  
Y. Okamoto ◽  
Y. Akagi ◽  
M. Koba

ABSTRACTWe investigated the electrical and optical properties, the chemical composition, the surface morphology and the crystallinity of sputtered Sn-doped In2O3 films deposited on different substrate positions. Both the electric conductivity and the optical transparency are related to the free carrier density and moreover the preferred crystal orientation. The former relation is attributed to the Burstein-Moss effect and the latter suggests the Sn doping mechanism.



1977 ◽  
Vol 48 (2) ◽  
pp. 739-749 ◽  
Author(s):  
V. J. Kapoor ◽  
F. J. Feigl ◽  
S. R. Butler


2020 ◽  
Vol 13 (4) ◽  
pp. 722-727
Author(s):  
ZHU Ye-xin ◽  
◽  
◽  
LI Ya-nan ◽  
SHI Wei-jie ◽  
...  


1986 ◽  
Vol 22 (23) ◽  
pp. 1266 ◽  
Author(s):  
D.G. Parker ◽  
P.G. Say


The Analyst ◽  
1995 ◽  
Vol 120 (10) ◽  
pp. 2579-2583 ◽  
Author(s):  
Xiaohua Cai ◽  
Božidar Ogorevc ◽  
Gabrijela Tavčar ◽  
Joseph Wang


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