Effects of swift heavy ion irradiation on the performance of HfO2-based resistive random access memory devices
2020 ◽
Vol 12
(2)
◽
pp. 02008-1-02008-4
Keyword(s):
2011 ◽
Vol 166
(8-9)
◽
pp. 739-742
◽
Keyword(s):
Keyword(s):
2017 ◽
Vol 495
◽
pp. 111-117
◽