Plasma Focus Radiative Model: Review of the Lee Model Code

2014 ◽  
Vol 33 (4) ◽  
pp. 319-335 ◽  
Author(s):  
S. Lee
Keyword(s):  
Plasma Focus ◽  
Lee Model Code ◽  
Lee Model ◽  
Model Code ◽  
Radiative Model ◽  
Model Review

Characteristics of Fast ion beam in Neon and Argon filled plasma focus correlated with Lee Model Code

Vacuum ◽  
2019 ◽  
Vol 169 ◽  
pp. 108916
Author(s):  
V. Damideh ◽  
O.H. Chin ◽  
S.H. Saw ◽  
P.C.K. Lee ◽  
R.S. Rawat ◽  
...  
Keyword(s):  
Plasma Focus ◽  
Ion Beam ◽  
Lee Model Code ◽  
Lee Model ◽  
Model Code ◽  
Fast Ion

Comparison of Measured Neutron Yield Versus Pressure Curves for FMPF-3, NX2 and NX3 Plasma Focus Machines Against Computed Results Using the Lee Model Code

2014 ◽  
Vol 34 (3) ◽  
pp. 474-479 ◽  
Author(s):  
S. H. Saw ◽  
P. Lee ◽  
R. S. Rawat ◽  
R. Verma ◽  
D. Subedi ◽  
...  
Keyword(s):  
Plasma Focus ◽  
Neutron Yield ◽  
Lee Model Code ◽  
Lee Model ◽  
Model Code

scholarly journals Comparison of measured pinch parameters versus pressure for SABALAN1 plasma focus facility against computed values using Lee model code

AIP Advances ◽  
2018 ◽  
Vol 8 (7) ◽  
pp. 075209 ◽  
Author(s):  
F. S. Karimi ◽  
S. Saviz ◽  
M. Ghoranneviss ◽  
M. K. Salem ◽  
F. M. Aghamir
Keyword(s):  
Plasma Focus ◽  
Lee Model Code ◽  
Lee Model ◽  
Model Code

scholarly journals Application of Lee Model Curve on Fitting of Discharge Current Curve of Plasma Focus Device

2021 ◽  
Vol 1 (1) ◽  
pp. 47-56
Author(s):  
Prakash Gautam
Keyword(s):  
Plasma Focus ◽  
Numerical Experiments ◽  
Electrical Circuit ◽  
Model Parameters ◽  
Lee Model Code ◽  
Lee Model ◽  
Model Code ◽  
Current Curve ◽  
Computer Based ◽  
Current Trace

A dense plasma focus is a table top machine producing a short-lived extremely popular plasma and cause fusion. Lee Model Code is a computer-based visual basic simulation package, which was successfully utilized in the plasma focus devices. The dynamics of plasma focus discharge is quite complicated, so to review and simplify the complication Lee Model couples electrical circuit with the plasma focus dynamics, radiation and therefore the thermodynamics. This enables us to simulate all of the gross focus properties. In this paper the numerical experiments are carried out to compute the current trace as a function of time for plasma focus (PF) device NX2. Results obtained by the numerical experiments are compared with the published laboratory measured data. This current fitting is completed to get the model parameters.

scholarly journals Introduction to Numerical Experiment on Plasma Focus using Lee Model Code

2015 ◽  
Vol 5 ◽  
pp. 137-141
Author(s):  
P. Gautam ◽  
R. Khanal
Keyword(s):  
Computer Simulation ◽  
Plasma Focus ◽  
Dense Plasma ◽  
Electrical Circuit ◽  
Dense Plasma Focus ◽  
Lee Model Code ◽  
Lee Model ◽  
Model Code ◽  
Hot Plasma ◽  
Simulation Package

A dense plasma focus is table top machine producing short-lived very hot plasma and can cause nuclear fusion. Lee Model Code is a computer simulation package, which was successfully used in Mather and Fillipov type plasma focus. Lee Model couples the electrical circuit with the plasma focus dynamics, radiation and thermodynamics to simplify the complicated dynamics of plasma focus. This package enables us to simulate and analyze all of the gross properties. In this paper we present the importance of current fitting and the relation of it with other plasma focus parameter and overview of Lee Model Code together with physical basis, scope and the results obtained from the Lee Model Code. The Himalayan Physics Year 5, Vol. 5, Kartik 2071 (Nov 2014)Page: 137-141

Determination of Ion Beam Properties In Nitrogen and Helium Using Mather Type Plasma Focus Device

2014 ◽  
Vol 71 (5) ◽  
Author(s):  
Someraa Saleh Shakonah ◽  
Jalil Ali ◽  
Natashah Abd. Rashid ◽  
Kashif Chaudhary
Keyword(s):  
Plasma Focus ◽  
Beam Energy ◽  
Ion Beam ◽  
Beam Current ◽  
Plasma Focus Device ◽  
Lee Model Code ◽  
Beam Source ◽  
Model Code ◽  
Pressure Regime

Some of ion beam properties have been investigated by using Lee model code on plasma focus devices which is operated with nitrogen and helium gases. The operation of plasma focus in different pressure regime gives a consistent ion beam properties which can make the plasma focus a reliable ion beam source .These ion beam properties such as ion beam flux, ion beam fluence, ion beam energy, ion beam current, and beam ion number corresponding to gas pressure have been studied for Mather type plasma focus device. The result shows the differences between helium as lighter gas and nitrogen as heavier gas in term of ion beam properties. The fluence and flux are decrease for nitrogen while increase for helium. 

scholarly journals Correlation of measured neon soft X-ray pulses of the INTI plasma focus with the reflected shock phase at 12KV

2014 ◽  
Vol 32 ◽  
pp. 1460327
Author(s):  
Federico A. Roy ◽  
Perk Lin Chong ◽  
Sor Heoh Saw
Keyword(s):  
Plasma Focus ◽  
Energy Window ◽  
Current Waveform ◽  
Lee Model Code ◽  
X Ray ◽  
Model Code ◽  
Reflected Shock ◽  
Shock Phase ◽  
Time Histories ◽  
Pinch Phase

The six-phase Lee Model Code is used to fit the computed current waveform to the measured waveform of the INTI Plasma Focus (PF;2.2 kJ at 12 kV), a T2 PF device, operated as a source of Neon soft X-ray (SXR) with optimum yield around 2.5 - 3 Torr of neon. The characteristic He-like and H-like neon line SXR pulse is measured using a pair of SXR detectors with selected filters that, by subtraction, have a photon energy window of 900 to 1550 eV covering the region of the characteristic neon SXR lines. The aim of this paper is to investigate the correlation between the time histories of the measured Neon soft X-ray pulse and the reflected shock phase of the computed current waveform which has been fitted to the measured current waveform. Results shows that the characteristic neon SXR measured at 3.17 J with a pulse duration of 249 ns starts typically after the radial inward shock phase and increases in magnitude few ns before the pinch phase. It tails unto the first anomalous resistance, and decays at the second anomalous resistance.

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