Determination of Ion Beam Properties In Nitrogen and Helium Using Mather Type Plasma Focus Device

2014 ◽  
Vol 71 (5) ◽  
Author(s):  
Someraa Saleh Shakonah ◽  
Jalil Ali ◽  
Natashah Abd. Rashid ◽  
Kashif Chaudhary
Keyword(s):  
Plasma Focus ◽  
Beam Energy ◽  
Ion Beam ◽  
Beam Current ◽  
Plasma Focus Device ◽  
Lee Model Code ◽  
Beam Source ◽  
Model Code ◽  
Pressure Regime

Some of ion beam properties have been investigated by using Lee model code on plasma focus devices which is operated with nitrogen and helium gases. The operation of plasma focus in different pressure regime gives a consistent ion beam properties which can make the plasma focus a reliable ion beam source .These ion beam properties such as ion beam flux, ion beam fluence, ion beam energy, ion beam current, and beam ion number corresponding to gas pressure have been studied for Mather type plasma focus device. The result shows the differences between helium as lighter gas and nitrogen as heavier gas in term of ion beam properties. The fluence and flux are decrease for nitrogen while increase for helium. 

Characteristics of Fast ion beam in Neon and Argon filled plasma focus correlated with Lee Model Code

Vacuum ◽  
2019 ◽  
Vol 169 ◽  
pp. 108916
Author(s):  
V. Damideh ◽  
O.H. Chin ◽  
S.H. Saw ◽  
P.C.K. Lee ◽  
R.S. Rawat ◽  
...  
Keyword(s):  
Plasma Focus ◽  
Ion Beam ◽  
Lee Model Code ◽  
Lee Model ◽  
Model Code ◽  
Fast Ion

scholarly journals Modelling and Electrical Characteristics of the Thailand Plasma Focus-II (TPF-II)

2017 ◽  
Vol 15 (6) ◽  
pp. 471-480
Author(s):  
Arlee TAMMAN ◽  
Mudtorlep NISOA ◽  
Boonchoat PAOSAWATYANYONG ◽  
Dheerawan BOONYAWAN ◽  
Nopporn POOLYARAT ◽  
...  
Keyword(s):  
Plasma Focus ◽  
Initial Conditions ◽  
Ion Beam ◽  
Short Circuit ◽  
Electrical Current ◽  
High Energy ◽  
Heating Process ◽  
Lee Model Code ◽  
Model Code ◽  
Short Circuit Test

The Thailand Plasma Focus II (TPF-II) is a 3.3 kJ dense plasma focus that was developed at Walailak University, Thailand. The aim of the device is to study the production of ion beams in the keV energy range and their applications for the color modification of gemstones. A high-energy ion beam is produced by heating and acceleration in the pinch phase of the plasma focus. The heating process is determined by the maximum electrical current, which can be optimized by variation of the system’s inductance. Lee model code was implemented to optimize the configuration of the electrodes. The current waveforms for the different initial conditions were used to obtain the system’s inductance, which was verified by a short circuit test. It was found that the inductance and resistance were about 153 nH and 12 mΩ, respectively.

scholarly journals A 160 kJ dual plasma focus (DuPF) for fusion-relevant materials testing and nano-materials fabrication

2014 ◽  
Vol 32 ◽  
pp. 1460322 ◽  
Author(s):  
S. H. Saw ◽  
V. Damideh ◽  
P. L. Chong ◽  
P. Lee ◽  
R. S. Rawat ◽  
...  
Keyword(s):  
Plasma Focus ◽  
Numerical Experiments ◽  
Ion Beam ◽  
Reactor Wall ◽  
Materials Testing ◽  
Nano Materials ◽  
Large Area ◽  
Lee Model Code ◽  
3D Design ◽  
Model Code

This paper summarizes PF-160 Dual Plasma Focus (DuPF) numerical experiments using the Lee Model code and preliminary 3D design drawings using SolidWorks software. This DuPF consists of two interchangeable electrodes enabling it to be optimized for both Slow Pinch Mode (SFM) and Fast Pinch Mode (FFM); the latter using a speed factor (SF) of 90 kA cm-1 Torr-0.5 for FFM in deuterium [S Lee et al, IEEE Trans Plasma Science 24, 1101-1105 (1996)]; and the former with SF of less than half that value for SFM. Starting with available 6 × 450 µF capacitors rated at 11kV (10% reversal), numerical experiments indicate safe operation at 9 kV, 6 Torr deuterium with FFM anode of 5 cm radius; producing intense ion beam and streaming plasma pulses which would be useful for studies of potential fusion reactor wall materials. On the other hand operating at 5 kV, 10 Torr deuterium with SFM anode of 10 cm radius leads to long-duration, uniform large-area flow which could be more suitable for synthesis of nano-materials. The dual plasma focus design is illustrated here with two figures showing FFM and SFM electrodes.

scholarly journals Correlation of measured neon soft X-ray pulses of the INTI plasma focus with the reflected shock phase at 12KV

2014 ◽  
Vol 32 ◽  
pp. 1460327
Author(s):  
Federico A. Roy ◽  
Perk Lin Chong ◽  
Sor Heoh Saw
Keyword(s):  
Plasma Focus ◽  
Energy Window ◽  
Current Waveform ◽  
Lee Model Code ◽  
X Ray ◽  
Model Code ◽  
Reflected Shock ◽  
Shock Phase ◽  
Time Histories ◽  
Pinch Phase

The six-phase Lee Model Code is used to fit the computed current waveform to the measured waveform of the INTI Plasma Focus (PF;2.2 kJ at 12 kV), a T2 PF device, operated as a source of Neon soft X-ray (SXR) with optimum yield around 2.5 - 3 Torr of neon. The characteristic He-like and H-like neon line SXR pulse is measured using a pair of SXR detectors with selected filters that, by subtraction, have a photon energy window of 900 to 1550 eV covering the region of the characteristic neon SXR lines. The aim of this paper is to investigate the correlation between the time histories of the measured Neon soft X-ray pulse and the reflected shock phase of the computed current waveform which has been fitted to the measured current waveform. Results shows that the characteristic neon SXR measured at 3.17 J with a pulse duration of 249 ns starts typically after the radial inward shock phase and increases in magnitude few ns before the pinch phase. It tails unto the first anomalous resistance, and decays at the second anomalous resistance.

Fabrication of DLC films by pulsed ion beam ablation in a dense plasma focus device

2009 ◽  
Vol 373 (45) ◽  
pp. 4169-4173 ◽  
Author(s):  
Z.P. Wang ◽  
H.R. Yousefi ◽  
Y. Nishino ◽  
H. Ito ◽  
K. Masugata
Keyword(s):  
Plasma Focus ◽  
Dense Plasma ◽  
Ion Beam ◽  
Plasma Focus Device ◽  
Dense Plasma Focus
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