Wrinkling surface of mono-layered thin film derived by using trifluoroacetate solution

2021 ◽  
Author(s):  
Zhirong Yang ◽  
Timing Qu ◽  
Feng Feng ◽  
Linli Wang ◽  
Pingfa Feng
Keyword(s):  
Thin Film ◽  
Layered Thin Film

scholarly journals Formation of artificially-Layered Thin-Film Compounds Using Pulsed-Laser Deposition

1995 ◽  
Vol 388 ◽  
Author(s):  
David P. Norton ◽  
B. C. Chakoumakos ◽  
D. H. Lowndes ◽  
J. D. Budai
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Layer Structure ◽  
Finite Thickness ◽  
Pulsed Laser ◽  
Unit Cell ◽  
Laser Deposition ◽  
Thickness Variation ◽  
Infinite Layer ◽  
Layered Thin Film

AbstractSuperlattice structures, consisting of SrCuO2, (Sr,Ca)CuO2, and BaCuO2 layers in the tetragonal, "infinite layer" crystal structure, have been grown by pulsed-laser deposition (PLD). Superlattice chemical modulation is observed for structures with component layers as thin as a single unit cell (~3.4 Å), indicating that unit-cell control of (Sr,Ca)CuO2 growth is possible using conventional pulsed-laser deposition over a wide oxygen pressure regime. X-ray diffraction intensity oscillations, due to the finite thickness of the film, indicate that these films are extremely flat with a thickness variation of only ~20 Å over a length scale of several thousand angstroms. Using the constraint of epitaxy to grow metastable cuprates in the infinite layer structure, novel high-temperature superconducting structural families have been formed. IN particular, epitaxially-stabilized SrCuO2/BaCuO2 superlattices, grown by sequentially depositing on lattice-matched (100) SrTiO3 from BaCuO2 and SrCuO2 ablation targets in a PLD system, show metallic conductivity and superconductivity at Tc(onset) ~70 K. these results show that pulsed-laser deposition and epitaxial stabilization have been used to effectively "engineer" artificially-layered thin-film materials.

Simulation of Contact Behavior of the Thin Film of Hard Disk at Head/Disk Interface

2011 ◽  
Vol 287-290 ◽  
pp. 2339-2342
Author(s):  
Hong Rui Ao ◽  
Deng Pan ◽  
Hong Yuan Jiang
Keyword(s):  
Thin Film ◽  
Hard Disk Drives ◽  
Hard Disk ◽  
Hertzian Contact ◽  
Von Mises Stress ◽  
Head Disk Interface ◽  
Disk Interface ◽  
Slider Motion ◽  
Von Mises ◽  
Layered Thin Film

The contact at head/disk interface in hard disk drives subject to an external shock has been studied using the finite element method. A rigid cylinder moving over a two-layered thin film was implemented to simulate the contact between the recording slider and the disk. The effects of different friction coefficients on the von Mises stress of two-layered thin film were investigated. The relation between pressed depth and width of deformation has been obtained. Results show that the amplitude decreases with increase of friction coefficient while the period of slider motion is diminution. In addition, the stress distribution fits Hertzian contact theory.

Effect of the Mechanical Properties and Geometric Parameters on the Crack Density of a Multi-Layered Thin Film Structure under Residual Tensile Stress

2014 ◽  
Vol 543-547 ◽  
pp. 1533-1536
Author(s):  
Ban Quan Yang ◽  
Xue Jun Chen ◽  
Wei Hai Sun ◽  
Hong Qian Chen ◽  
Jing Wen Pan ◽  
...  
Keyword(s):  
Thin Film ◽  
Mechanical Properties ◽  
Tensile Stress ◽  
Fracture Behavior ◽  
Crack Density ◽  
Film Structure ◽  
Geometric Parameters ◽  
Residual Tensile Stress ◽  
Thin Film Structure ◽  
Layered Thin Film

The effect of the mechanical properties and geometric parameters on the crack density of a multi-layered thin film structure under residual tensile stress is investigated theoretically. The numerical results show that the crack density of the thin film decreases with the increase of the thickness of the thin film and (or) the fracture strength of the thin film. These results can help us more deeply understand the fracture behavior of the multi-layered thin film structure under residual tensile stress.

Sign in / Sign up

Export Citation Format

Share Document