Computation-skip Error Mitigation Scheme for Power Supply Voltage Scaling in Recursive Applications

2016 ◽  
Vol 84 (3) ◽  
pp. 413-424 ◽  
Author(s):  
Yanxiang Huang ◽  
Meng Li ◽  
Chunshu Li ◽  
Peter Debacker ◽  
Liesbet Van der Perre
2010 ◽  
Vol E93-C (3) ◽  
pp. 332-339 ◽  
Author(s):  
Tadashi YASUFUKU ◽  
Taro NIIYAMA ◽  
Zhe PIAO ◽  
Koichi ISHIDA ◽  
Masami MURAKATA ◽  
...  

2006 ◽  
Vol 913 ◽  
Author(s):  
Georges Guegan ◽  
Romain Gwoziecki ◽  
Olivier Gonnard ◽  
Gilles Gouget ◽  
Christine Raynaud ◽  
...  

AbstractThe temperature rise in SOI has been measured on two successive generations. This work shows that self-heating effects become less and less severe with both MOSFET and power supply voltage scaling.


2011 ◽  
Vol E94-C (6) ◽  
pp. 1072-1075
Author(s):  
Tadashi YASUFUKU ◽  
Yasumi NAKAMURA ◽  
Zhe PIAO ◽  
Makoto TAKAMIYA ◽  
Takayasu SAKURAI

2016 ◽  
Vol E99.C (10) ◽  
pp. 1219-1225
Author(s):  
Masahiro ISHIDA ◽  
Toru NAKURA ◽  
Takashi KUSAKA ◽  
Satoshi KOMATSU ◽  
Kunihiro ASADA

1993 ◽  
Vol 29 (15) ◽  
pp. 1324 ◽  
Author(s):  
L.E. Larson ◽  
M.M. Matloubian ◽  
J.J. Brown ◽  
A.S. Brown ◽  
M. Thompson ◽  
...  

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