Evidence of Reduced Self Heating with Partially Depleted SOI MOSFET Scaling
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AbstractThe temperature rise in SOI has been measured on two successive generations. This work shows that self-heating effects become less and less severe with both MOSFET and power supply voltage scaling.
1995 ◽
Vol 42
(6)
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pp. 2122-2126
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2010 ◽
Vol E93-C
(3)
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pp. 332-339
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2016 ◽
Vol 84
(3)
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pp. 413-424
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2011 ◽
Vol E94-C
(6)
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pp. 1072-1075
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2016 ◽
Vol E99.C
(10)
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pp. 1219-1225
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