scholarly journals The Potential Scope of the Ultrasonic Surface Reflection Method Towards Mechanical Characterisation of Isotropic Materials. Part 2. Experimental Results

Author(s):  
V. Tinard ◽  
P. François ◽  
C. Fond
2014 ◽  
Vol 38 ◽  
pp. 53-61
Author(s):  
Mardeni Bin Roslee ◽  
Intan Suraya Shahdan ◽  
Khazaimatol Shima Subari

Materials ◽  
2019 ◽  
Vol 12 (11) ◽  
pp. 1875 ◽  
Author(s):  
Jun-jie Chang ◽  
Yuan-yuan Li ◽  
Xue-feng Zeng ◽  
Hai-ying Zhong ◽  
Tao-lei Wan ◽  
...  

The reflected waves received from ultrasonic waves propagating in materials contain information that constitutes the physical properties, material composition, defects, and degradation states. When measuring the dynamic viscoelasticity, the traditional bottom reflection method (BRM) cannot be used to measure the bottom irregular samples. In this paper, the storage modulus, loss modulus, and loss tangent are extracted by the surface reflection method (SRM) to evaluate the elastomer sample viscoelasticity. A theoretical study on the phase change caused by multiple reflections in the case of non-thin layer coupling is conducted. Based on this research, the experimental system is built. The results show that considering the thickness of the coupling layer can optimize the determination of viscoelasticity and reduce the error of the viscoelastic evaluation results of an elastomer with the traditional BRM. Finally, based on the principle of the SRM, the density of the elastomers is measured, and the feasibility and overall efficiency of this method are verified by experiments.


2021 ◽  
Vol 17 (17) ◽  
Author(s):  
Asrafusjaman Rubel ◽  
M. A. Kabir ◽  
Masud Rana ◽  
Ariful Islam ◽  
Md. Shawkut Ali Khan

This paper focuses on examining the characteristic analysis of the textured and diffused silicon wafer. Characterization performance of the textured and diffused wafer using surface reflection method, sheet resistance method, SEM, and surface photovoltage method is examined. From the SRM result, it is observed that the reflection of the textured wafer is lower than the raw wafer. This means that the textured wafer forms the pyramid structure, which was measured by SEM. Sheet resistance measures the resistivity of the raw wafer and after phosphorous diffusion into the p-type silicon, the wafer are 2.3 Ω-cm and 0.80 Ω-cm respectively. From the sheet resistance results, it is observed that the phosphorus doping is properly done. The Surface Photovoltage (SPV) result shows that minority carrier diffusion length and lifetime for a solar cell is 86.4μm and 2.8 μsec respectively.


2015 ◽  
Vol 9 (13) ◽  
pp. 71
Author(s):  
Yap C. W. ◽  
Mardeni R. ◽  
Ahmad N. N.

Soil moisture is one of the critical components to be investigated in civil, geological and agricultural works. This is because the parameter can affect the physical and electromagnetic characteristics of soil, such as density and permittivity and this can further restricts soil application. Unfortunately, finding a suitable non-destructive model for accurate soil moisture determination is challenging. In this article, the concept and development of soil moisture determination via ground penetrating radar (GPR) principle and surface reflection method is explained. The system is designed to be used with standard horn antenna with a frequency of 1.7-2.6 GHz along with vector network analyzer (VNA). The proposed system can measure soil moisture of three types of soil samples such as sand, loamy, and clay with high degree of accuracy. In this research, microwave surface reflection method is applied to analyze the effect of soil moisture with its electrical properties using our novel GPR principle. The result of the research is promising with high percentage of agreement with Topp theoretical value. The values are 31% to 61% for sand, 5% to 42% for clay, and 44% to 54% for loamy. For validation on the system, a new type of soil is used for measurement, and the result has an accuracy of 93%. By using the proposed developed models, soil moisture estimation can be easily determined with minimal data input through a novelty GPR surface reflection method.


Basic results of Biot and Hill concerning (i) the elastic moduli of initially isotropic materials and (ii) Cauchy symmetry for large deformation are combined. The result is a system of hyperbolic differential equations to be satisfied by the elastic potential as a function of the principal stretches. Imposing these restrictions, the elastic potential for any strain is shown to be a functional of the elastic potential for pure dilatation. The theory is to some extent corroborated by experimental results on foam rubber by Blatz & Ko ( Trans. Soc. Rheol . 6, 223 (1962)).


2010 ◽  
Vol 136 ◽  
pp. 140-143 ◽  
Author(s):  
Chun Yuan Liu ◽  
Bo Zhou ◽  
Xiao Min Zhao

To overcome the noisy background comes from surface reflection, spectrum overlapping and dust noisy. In this paper, a novel modified continuous wavelet transform profilometry is proposed, which employs a fringe image and a flat image to eliminate the background. Both the fringe and flat pattern are projected onto the object by a projector. With the subtraction of the flat image from the fringe image, the background is completely removed and the spectrum overlapping in the frequency domain is prevented. Experimental results showed that the proposed method got a better result than the traditional CWT.


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