Environmental characterization of a Mediterranean protected shallow brackish coastal aquatic system, Klisova Lagoon, Western Greece: a case study

2016 ◽  
Vol 21 (1) ◽  
pp. 115-125
Author(s):  
P. Avramidis ◽  
K. Nikolaou ◽  
K. Poulos ◽  
V. Bekiari ◽  
A. Vantarakis
Author(s):  
D. L. Callahan

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.


2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  

Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.


Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.


Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.


Water ◽  
2021 ◽  
Vol 13 (13) ◽  
pp. 1863
Author(s):  
Luciana Cristina de Carvalho Santa-Rosa ◽  
Sibelle Trevisan Disaró ◽  
Violeta Totah ◽  
Silvia Watanabe ◽  
Ana Tereza Bittencourt Guimarães

Living benthic foraminifera (>63 µm) were studied to characterize the continental slope of the Potiguar Basin (SW Atlantic). Foraminifers from the surface (0–2 cm), subsurface (2–5 cm), and integrated (0–5 cm) sediment layers were analyzed to verify their contribution to environmental characterization. It was also estimated if and which changes occur when the subsurface is added. Sampling stations were distributed in five transects in four isobaths (150, 400, 1000, and 2000 m). Sediment samples were fixed with 4% buffered formaldehyde and stained with Bengal rose. Were recorded 396 species in the surface layer, 228 in the subsurface, and 449 in integrating both layers. This study did not include tubular agglutinated species. The assemblages from 150 m isobath indicated the upper slope, from 400 m indicated the middle slope and the ones from the 2000 m indicated the lower slope. The surface layer’s assemblage at 1000 m isobath was more similar to the middle slope; in contrast, its subsurface layer´s assemblage had more similarity with the lower slope. Rarefaction curves, Permanova, and NMDS routines indicated a high resemblance between surface and integrated layers. Therefore, the first two centimeters were sufficient to characterize this region based on living benthic foraminifera.


Sign in / Sign up

Export Citation Format

Share Document