Investigation of cerium oxide thin film thickness using THz spectroscopy for non-destructive measurement

The thickness of thin films determines the films’ unique properties, due to which they are widely used in optics and electronics. To measure the thickness of films in the range of 1 nm — 1 mcm during film deposition or on a finished product, it is important that non-destructive measurement methods should be used. An analysis of the most commonly used non-destructive methods for measuring and controlling the thickness of thin films is performed, with a possibility of in situ control of the technological process as well as for testing of finished products. This work describes theoretical and practical considerations of using reflection high-energy electron diffraction, piezoelectricity, interferometry and gravimetric methods for thin film thickness measurements. The results of the study can be used for selecting an optimal method of obtaining thin films when conducting theoretical and applied research.

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Structural, Optical and Electrical Properties of Multiple Layers Nano-Structured Zinc Oxide Thin Film

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.1109.401 ◽

2015 ◽

Vol 1109 ◽

pp. 401-404

Author(s):

I. Saurdi ◽

Mohamad Hafiz Mamat ◽

M.F. Malik ◽

A. Ishak ◽

Mohamad Rusop

Keyword(s):

Thin Film ◽

Thin Films ◽

Film Thickness ◽

Visible Region ◽

Oxide Thin Film ◽

Zno Thin Films ◽

Zno Thin Film ◽

Thin Film Thickness ◽

Glass Substrates ◽

Average Transmittance

The nanoStructured ZnO thin films were prepared by Spin coating technique on glass substrates at various layers. The structural and optical properties were characterized by field emission scanning electron microscopy (FESEM) and UV-Vis-NIR respectively. The surface morphology reveals that the nanostructured ZnO thin films become densely packed as the thickness increased. The average particles size of ZnO thin film estimated from FESEM images at different layers of 1, 3, 5, 7, 9 were 20nm, 28nm, 36nm, 39nm and 56nm, respectively. The surface roughness of thin films was increase as the thin film thickness increases. The results show all films are transparent in the visible region (400-800 nm) with average transmittance above 85 %. Meanwhile, the optical band gap was decrease as the film thickness increases. The conductivity of ZnO thin film slightly improved as the thickness increased as measured through two probes 1-V measurement system.

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Sensitivity analysis of eddy current sensor parameters for non-destructive measurement of zirconium oxide thin film using 3D finite element

2006 12th Biennial IEEE Conference on Electromagnetic Field Computation ◽

10.1109/cefc-06.2006.1633216 ◽

2006 ◽

Author(s):

A. Abakar ◽

J.-C. Verite ◽

R. Cauvin

Keyword(s):

Thin Film ◽

Sensitivity Analysis ◽

Finite Element ◽

Eddy Current ◽

Zirconium Oxide ◽

Oxide Thin Film ◽

Current Sensor ◽

3D Finite Element ◽

Destructive Measurement ◽

Non Destructive

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Skin protection against UV radiation using thin films of cerium oxide

Radioprotection ◽

10.1051/radiopro/2019002 ◽

2019 ◽

Vol 54 (1) ◽

pp. 67-70 ◽

Cited By ~ 2

Author(s):

E. Ortiz ◽

L. Martínez-Gómez ◽

J.F. Valdés-Galicia ◽

R. García ◽

M. Anzorena ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Radiation Dose ◽

Film Thickness ◽

Titanium Oxide ◽

Cerium Oxide ◽

Thin Film Thickness ◽

Skin Sample ◽

Alternative Material ◽

The Difference

In this work, we evaluated the efficiency of cerium oxide as sunscreen using titanium oxide as standard comparison material. Geant4 software was used to perform numerical simulation, we calculated the radiation dose that ultraviolet radiation deposits in a skin sample as a function of thin film thickness of the sunscreens. We found that in the interval between 5 and 15 nm of the thin film thickness and for wavelengths between 160 and 400 nm, cerium oxide has the potential to reduce the radiation dose more than 10% with respect to the same thickness band of titanium oxide. Using thin films of cerium oxide and titanium oxide with same thicknesses and greater than 45 nm, the difference in the attenuation of the radiation dose for both materials is less than 1%. The results lead us to propose cerium oxide as an alternative material to titanium oxide for the manufacture of sunscreens.

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Measurement of thin film thickness by means of a simple non-destructive radioisotopic technique

Thin Solid Films ◽

10.1016/0040-6090(80)90468-x ◽

1980 ◽

Vol 67 (2) ◽

pp. 347-351 ◽

Cited By ~ 3

Author(s):

G. Luzzi ◽

A. Mazzel ◽

A. Neri ◽

M. Salmi ◽

G.Schirripa Spagnolo

Keyword(s):

Thin Film ◽

Film Thickness ◽

Thin Film Thickness ◽

Non Destructive

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Deformation Property of Dense Oxide Coated Magnesium Alloy Surface

Materials Science Forum ◽

10.4028/www.scientific.net/msf.1016.1591 ◽

2021 ◽

Vol 1016 ◽

pp. 1591-1596

Author(s):

Akira Watazu ◽

Tsutomu Sonoda

Keyword(s):

Thin Film ◽

Magnesium Alloy ◽

Film Thickness ◽

Magnesium Oxide ◽

Single Phase ◽

Deformation Property ◽

The Other ◽

Oxide Thin Film ◽

Radio Frequency Magnetron Sputtering ◽

Thin Film Thickness

Dense oxide coated AZ 31 magnesium alloy surfaces were uniformly formed using a radio frequency magnetron sputtering method. The magnesium oxide thin film thickness was about 240 nm. XRD results of the film indicated that film of magnesium oxide single phase was deposited. The surface of the film was uniform and no crack was observed. The Vickers hardness measured by the nanoindenter was about Hv80 and Hv200 for the AZ31 substrate and the sample coated with the thin film, respectively. The dynamic hardness of the AZ31 substrate and the sample coated with the thin film were almost the same. In the curve at the time of pressurization, a step was observed in the sample coated with the thin film. On the other hand, many steps were observed in the data curve for the thin film deposited on the glass substrate.

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