An Analytical Model Including Interface Traps and Temperature Effects in Negative Capacitance Double Gate Field Effect Transistor
2015 ◽
Vol 36
(5)
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pp. 054002
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2017 ◽
Vol 56
(5)
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pp. 054201
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2016 ◽
Vol 55
(4S)
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pp. 04EB08
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2019 ◽
Vol 34
(6)
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pp. 065008
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Keyword(s):
2013 ◽
Vol 10
(5)
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pp. 1202-1208
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Keyword(s):
Keyword(s):
2015 ◽
Vol 36
(2)
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pp. 024001
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