X-ray determination of the thermal expansion of calcium molybdate

1969 ◽  
Vol 30 (10) ◽  
pp. 2484-2486 ◽  
Author(s):  
V.T. Deshpande ◽  
S.V. Suryanarayana
Keyword(s):  
Thermal Expansion ◽  
X Ray ◽  
Calcium Molybdate

High Temperature Guinier X-Ray Diffractometry for Thermal Expansion Measurements in the Hexagonal form of Cordierite ((2MgO•2Al2O3•5SiO2)

1983 ◽  
Vol 27 ◽  
pp. 397-404
Author(s):  
J. S. Pressnall ◽  
J. J. Fitzpatrick ◽  
Paul Predecki
Keyword(s):  
Thermal Expansion ◽  
High Temperature ◽  
Close Agreement ◽  
Accurate Determination ◽  
Critical Test ◽  
Lattice Thermal Expansion ◽  
X Ray ◽  
Hexagonal Form ◽  
Computer Controlled

AbstractA computer-controlled high temperature Guinier diffractometer system for accurate determination of lattice thermal expansion is described. A critical test of the system using α-Al2O3 (0.3μ polishing alumina) showed close agreement with the single crystal expansion data of Wachtman et al. Lattice thermal expansion of cordierite doped with the following dopants: Ge+4, P+5, Zn+2, Li+1 and Ca+2 was investigated. Of these the Li+1 at the 5% level (5% of Si+4 replaced by Li+1 + Al+3) produced the largest decrease in mean lattice expansion.

Phase Transitions and Thermal Expansion of 10mol%Sc2O3-1mol% CeO2-ZrO2 Ceramics

2007 ◽  
Author(s):  
Sergey Yarmolenko ◽  
Devendra Ray ◽  
Devdas Pai ◽  
Jag Sankar
Keyword(s):  
Thermal Expansion ◽  
Phase Transitions ◽  
Grain Structure ◽  
Slow Phase ◽  
Cubic Phase ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Operational Conditions ◽  
Β Phase

Phase transitions and CTE of 10mol%Sc2O3-1mol%CeO2-ZrO2 ceramics sintered from two commercial powders produced by Praxair Surface Technologies, USA and DKKK, Japan are studied. Morphology of powders and grain structure of ceramics were studied by SEM and AFM. Ceramics produced from Praxair powder exist in cubic phase while DKKK-based ceramics exhibit slow phase transformation from cubic to rhombohedral (β) phase at temperatures 350–400°C. c-β Phase transition temperature is 440°C obtained by high temperature x-ray diffractometry (HTXRD) and differential scanning calorimetry. Coefficients of thermal expansion of cubic and β-phases were calculated from temperature dependence of lattice parameters obtained by HTXRD in the temperature range of 25–800°C. These results can be further used for the optimal design of SOFC layered structures as well as for determination of their reliability and durability under operational conditions.

Confirmation of the new technique for measuring the linear thermal expansion of silicon

1993 ◽  
Vol 8 (1) ◽  
pp. 36-38 ◽  
Author(s):  
Liu Fengchao
Keyword(s):  
Thermal Expansion ◽  
Room Temperature ◽  
Accurate Determination ◽  
Linear Thermal Expansion ◽  
Linear Expansion Coefficient ◽  
X Ray ◽  
High Purity Silicon ◽  
Different Temperatures ◽  
Better Than

This paper further confirms that the direct measurement of diffraction angles at different temperatures by using the X-ray diffractometer is better than measurement of the lattice parameters for the rapid and accurate determination of the linear thermal expansion of silicon. High purity silicon has the linear expansion coefficient, α= (2.45±0.05) × 10−6/°C at room temperature. This value does not change for doped P-type and N-type silicon.

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