A study of Al/PtSi/Si thin film reaction kinetics by X-ray diffraction

Silver (Ag) particles have sparked considerable interest in industry and academia, particularly for health and medical applications. Here, we present the “green” and simple synthesis of an Ag particle-based silicone (Si) thin film for medical device applications. Drop-casting and peel-off techniques were used to create an Si thin film containing 10–50% (v/v) of Ag particles. Electro impedance spectroscopy (EIS), X-ray diffraction analysis (XRD), scanning electron microscopy (SEM), energy dispersive X-ray (EDX), and tensile tests were used to demonstrate the electrical conductivity, crystallinity, morphology-elemental, and mechanical properties, respectively. The oriented crystalline structure and excellent electronic migration explained the highest conductivity value (1.40 × 10−5 S cm−1) of the 50% Ag–Si thin film. The findings regarding the evolution of the conductive network were supported by the diameter and distribution of Ag particles in the Si film. However, the larger size of the Ag particles in the Si film resulted in a lower tensile stress of 68.23% and an elongation rate of 68.25% compared to the pristine Si film. The antibacterial activity of the Ag–Si film against methicillin-resistant Staphylococcus aureus (MRSA), Bacillus cereus (B. cereus), Klebsiella pneumoniae (K. pneumoniae), and Pseudomonas aeruginosa (P. aeruginosa) was investigated. These findings support Si–Ag thin films’ ability to avoid infection in any medical device application.

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Exploring Ni–Si thin-film reactions by means of simultaneous synchrotron X-Ray diffraction and substrate curvature measurements

Materials Science and Engineering B ◽

10.1016/j.mseb.2004.07.037 ◽

2004 ◽

Vol 114-115 ◽

pp. 67-71 ◽

Cited By ~ 12

Author(s):

Patrice Gergaud ◽

Christian Rivero ◽

Marc Gailhanou ◽

Olivier Thomas ◽

Benoit Froment ◽

...

Keyword(s):

Thin Film ◽

X Ray Diffraction ◽

X Ray ◽

Curvature Measurements ◽

Substrate Curvature ◽

Si Thin Film

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Silicidation in Ni/Si thin film system investigated by X-ray diffraction and Auger electron spectroscopy

Applied Surface Science ◽

10.1016/j.apsusc.2006.07.091 ◽

2007 ◽

Vol 253 (8) ◽

pp. 3799-3802 ◽

Cited By ~ 15

Author(s):

S. Abhaya ◽

G. Amarendra ◽

S. Kalavathi ◽

Padma Gopalan ◽

M. Kamruddin ◽

...

Keyword(s):

Thin Film ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Film System ◽

X Ray Diffraction ◽

X Ray ◽

Thin Film System ◽

Si Thin Film

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In-situ investigation by X-ray diffraction and wafer curvature of phase formation and stress evolution during metal thin film – silicon reactions

Zeitschrift für Kristallographie Supplements ◽

10.1524/zksu.2007.2007.suppl_26.81 ◽

2007 ◽

Vol 2007 (suppl_26) ◽

pp. 81-89

Author(s):

O. Thomas

Keyword(s):

Thin Film ◽

Phase Formation ◽

Stress Evolution ◽

X Ray Diffraction ◽

X Ray ◽

Wafer Curvature ◽

Thin Film Silicon ◽

Metal Thin Film ◽

In Situ Investigation

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Palladium Nanowire Thin Films via Template Growth

MRS Proceedings ◽

10.1557/proc-775-p4.7 ◽

2003 ◽

Vol 775 ◽

Author(s):

Donghai Wang ◽

David T. Johnson ◽

Byron F. McCaughey ◽

J. Eric Hampsey ◽

Jibao He ◽

...

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Thin Films ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Conductive Substrate ◽

Palladium Nanowires ◽

Efficient Route ◽

Silica Thin Film

AbstractPalladium nanowires have been electrodeposited into mesoporous silica thin film templates. Palladium continually grows and fills silica mesopores starting from a bottom conductive substrate, providing a ready and efficient route to fabricate a macroscopic palladium nanowire thin films for potentially use in fuel cells, electrodes, sensors, and other applications. X-ray diffraction (XRD) and transmission electron microscopy (TEM) indicate it is possible to create different nanowire morphology such as bundles and swirling mesostructure based on the template pore structure.

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Deep learning for visualization and novelty detection in large X-ray diffraction datasets

npj Computational Materials ◽

10.1038/s41524-021-00575-9 ◽

2021 ◽

Vol 7 (1) ◽

Author(s):

Lars Banko ◽

Phillip M. Maffettone ◽

Dennis Naujoks ◽

Daniel Olds ◽

Alfred Ludwig

Keyword(s):

Thin Film ◽

Crystal Structure ◽

Artificial Intelligence ◽

Deep Learning ◽

Novelty Detection ◽

Structural Similarity ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Patterns ◽

Post Hoc

AbstractWe apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a similarly conditioned VAE is uniquely effective at knowing what it doesn’t know: it can rapidly identify data outside the distribution it was trained on, such as novel phases and mixtures. These capabilities demonstrate that a VAE is a valuable AI agent for aiding materials discovery and understanding XRD measurements both ‘on-the-fly’ and during post hoc analysis.

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Quantitative Study of Al/W Interaction In Si/SiO2/W-Ti/Al Thin Film System

MRS Proceedings ◽

10.1557/proc-119-153 ◽

1988 ◽

Vol 119 ◽

Cited By ~ 5

Author(s):

Hung-Yu Liu ◽

Peng-Heng Chang ◽

Jim Bohlman ◽

Hun-Lian Tsai

Keyword(s):

Thin Film ◽

Film System ◽

X Ray Diffraction ◽

Compound Formation ◽

X Ray ◽

Thin Film System ◽

Glancing Angle ◽

Integrated Intensity ◽

Al Thin Film ◽

Kinetics Of

AbstractThe interaction of Al and W in the Si/SiO2/W-Ti/Al thin film system is studied quantitatively by glancing angle x-ray diffraction. The formation of Al-W compounds due to annealing is monitored by the variation of the integrated intensity from a few x-ray diffraction peaks of the corresponding compounds. The annealing was conducted at 400°C, 450°C and 500°C from 1 hour to 300 hours. The kinetics of compound formation is determined using x-ray diffraction data and verified by TEM observations. We will also show the correlation of the compound formation to the change of the electrical properties of these films.

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