Direct-transmission electron microscopy and activity measurements on thin copper film catalysts

1967 ◽  
Vol 8 (3) ◽  
pp. 307-312 ◽  
Author(s):  
N.A. Nielsen ◽  
K.B. Keating ◽  
W.R. Miller
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Copper Film ◽  
Direct Transmission ◽  
Transmission Electron ◽  
Activity Measurements ◽  
Thin Copper Film

Anomalous Desorption of Copper Oxide Observed by In Situ Transmission Electron Microscopy

1997 ◽  
Vol 3 (2) ◽  
pp. 121-125 ◽  
Author(s):  
Judith C. Yang ◽  
Mark Yeadon ◽  
Deirdre Olynick ◽  
J. Murray Gibson
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cuprous Oxide ◽  
Copper Film ◽  
Copper Oxides ◽  
Simultaneous Exposure ◽  
Methanol Vapor ◽  
Transmission Electron ◽  
Thin Copper Film

Abstract: Here we present our observations of an anomalous desorption of copper oxides from a thin copper film during annealing as observed in an in situ transmission electron microscope. The epitaxial cuprous oxide that formed in air was observed to disappear when the specimen was annealed at 300°C and 10−8 torr. However, removal of the cuprous oxide that formed during oxidation in the microscope required both heating at 300°C and simultaneous exposure to methanol vapor.

scholarly journals High Resolution Transmission Electron Microscopy of Metallic Film/Laser-Irradiated Alumina Couples.

1994 ◽  
Vol 357 ◽  
Author(s):  
A. J. Pedraza ◽  
Siqi Cao ◽  
L. F. Allard ◽  
D. H. Lowndes
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Copper Film ◽  
Interfacial Structure ◽  
Diffuse Interface ◽  
Cross Sectional ◽  
Polycrystalline Alumina ◽  
Near Surface ◽  
Transmission Electron

AbstractA near-surface thin layer is melted when single crystal alumina (sapphire) is pulsed laserirradiated in an Ar-4%H2 atmosphere. γ-alumina grows epitaxially from the (0001) face of axalumina (sapphire) during the rapid solidification of this layer that occurs once the laser pulse is over. Cross sectional high resolution transmission electron microscopy (HRTEM) reveals that the interface between unmelted sapphire and γ-alumina is atomistically flat with steps of one to a few close-packed oxygen layers; however, pronounced lattice distortions exist in the resolidified γ-alumina. HRTEM also is used to study the metal-ceramic interface of a copper film deposited on a laser-irradiated alumina substrate. The observed changes of the interfacial structure relative to that of unexposed substrates are correlated with the strong enhancement of film-substrate bonding promoted by laser irradiation. HRTEM shows that a thin amorphous film is produced after irradiation of 99.6% polycrystalline alumina. Formation of a diffuse interface and atomic rearrangements that can take place in metastable phases contribute to enhance the bonding strength of copper to laser-irradiated alumina.

scholarly journals Real-time direct transmission electron microscopy imaging of phase and morphology transformation from solid indium oxide hydroxide to hollow corundum-type indium oxide nanocrystallites

Nanoscale ◽  
2019 ◽  
Vol 11 (25) ◽  
pp. 12242-12249
Author(s):  
Lukas Schlicker ◽  
Radian Popescu ◽  
Maged F. Bekheet ◽  
Andrew Doran ◽  
Dagmar Gerthsen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Real Time ◽  
Indium Oxide ◽  
Direct Transmission ◽  
Microscopy Imaging ◽  
Oxide Hydroxide ◽  
Transmission Electron ◽  
Hollow Nanostructures

This work clarifies the mechanism of the formation of hollow nanostructures (nanotubes and nanospheres) during the InOOH to rh-In2O3 transformation.

A Study of Gaseous and Organic Inclusions in Copper Electrodeposit by Transmission Electron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 644-645
Author(s):  
S. Nakahara ◽  
A. Staudinger
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Room Temperature ◽  
Copper Film ◽  
Organic Additive ◽  
Sulfate Electrolyte ◽  
Copper Sheet ◽  
Transmission Electron ◽  
Copper Electrodeposit ◽  
A Current

It was recently shown (1) that gaseous and organic inclusions in electrodeposits can he detected "by transmission electron microscopy (TEM) using a through-focus imaging technique. In this study, we have investigated the sites for incorporation of inclusions and their spacial distribution in copper electrodeposit by TEM.A copper film was electrodeposited on an annealed OFHC copper sheet in a sulfate electrolyte (200 g/l CuSo4-5H2O, 50 g/l H2So4) containing 5 M Mol./l O-phenanthroline as an organic additive. Plating was carried out at room temperature and at a current density of 5 MA/cm2.In order to detect gaseous and organic inclusions, all copper deposits were examined in overfocussed as well as underfocussed conditions. In each case, stereo-pairs(2) were obtained. Figures 1 and 2 show stereo-pairs of the deposited copper film taken in overfocussed and underfocussed conditions, respectively.

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