Solid state chemical ionization for characterization of organic compounds by laser mass spectrometry

Talanta ◽  
1989 ◽  
Vol 36 (1-2) ◽  
pp. 117-124 ◽  
Author(s):  
Kesagapillai Balasanmugam ◽  
Somayajula Kasi Viswanadham ◽  
David M. Hercules
Author(s):  
D. M. Hercules ◽  
C. D. Parker ◽  
K. Balasanmugam ◽  
S. K. Viswanadham

2019 ◽  
Vol 12 (3) ◽  
pp. 1861-1870 ◽  
Author(s):  
Alexander Zaytsev ◽  
Martin Breitenlechner ◽  
Abigail R. Koss ◽  
Christopher Y. Lim ◽  
James C. Rowe ◽  
...  

Abstract. Chemical ionization mass spectrometry (CIMS) instruments routinely detect hundreds of oxidized organic compounds in the atmosphere. A major limitation of these instruments is the uncertainty in their sensitivity to many of the detected ions. We describe the development of a new high-resolution time-of-flight chemical ionization mass spectrometer that operates in one of two ionization modes: using either ammonium ion ligand-switching reactions such as for NH4+ CIMS or proton transfer reactions such as for proton-transfer-reaction mass spectrometer (PTR-MS). Switching between the modes can be done within 2 min. The NH4+ CIMS mode of the new instrument has sensitivities of up to 67 000 dcps ppbv−1 (duty-cycle-corrected ion counts per second per part per billion by volume) and detection limits between 1 and 60 pptv at 2σ for a 1 s integration time for numerous oxygenated volatile organic compounds. We present a mass spectrometric voltage scanning procedure based on collision-induced dissociation that allows us to determine the stability of ammonium-organic ions detected by the NH4+ CIMS instrument. Using this procedure, we can effectively constrain the sensitivity of the ammonia chemical ionization mass spectrometer to a wide range of detected oxidized volatile organic compounds for which no calibration standards exist. We demonstrate the application of this procedure by quantifying the composition of secondary organic aerosols in a series of laboratory experiments.


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