Summation of very close spatial frequencies: the importance of spatial probability summation

Purpose: To determine binocular summation of surgically treated intermittent exotropia (IXT) patients by measuring the contrast threshold.Methods: We recruited 38 surgically treated IXT patients aged 8–24 years and 20 age-matched healthy controls. All participants had normal or corrected-to-normal visual acuity (Snellen ≥ 20/20) in both eyes. The IXT patients had undergone the surgery at least a year prior to the study. Twenty-one of them obtained good alignment and 17 experienced a recurrence of exotropia. We measured the observers' monocular and binocular contrast sensitivities (CS) at six spatial frequencies (1.5, 3, 6, 12, 18, 24 cycles/degree) as an index of visual information processing at the threshold level. Binocular summation was evaluated against a baseline model of simple probability summation based on the CS at each spatial frequency and the area under the log contrast sensitivity function (AULCSF).Results: The exo-deviation of IXTs with good alignment was −6.38 ± 3.61 prism diopters (pd) at 33 cm and −5.14 ± 4.07 pd at 5 m. For the patients with recurrence, it was −23.47 ± 5.53 pd and −21.12 ± 4.28 pd, respectively. There was no significant difference in the binocular summation ratio (BSR) between the surgically treated IXT patients, including those with good alignment and recurrence, and normal controls at each spatial frequency [F(2,55) = 0.416, P = 0.662] and AULCSF [F(2,55) = 0.469, P = 0.628]. In addition, the BSR was not associated with stereopsis (r = −0.151, P = 0.365).Conclusion: Our findings of normal contrast sensitivity binocular summation ratio in IXT after surgical treatment suggest that the ability of the visual cortex in processing binocular information is intact at the contrast threshold level.

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Spatial probability summation and disinhibition in psychophysically measured line-spread functions

Vision Research ◽

10.1016/0042-6989(79)90145-7 ◽

1979 ◽

Vol 19 (5) ◽

pp. 593-598 ◽

Cited By ~ 15

Author(s):

Hugh R. Wilson ◽

Greg Phillips ◽

Ingo Rentschler ◽

Rudolf Hilz

Keyword(s):

Probability Summation ◽

Spatial Probability ◽

Measured Line ◽

Line Spread

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The Imaging of Crystal Structures and Crystal Defects

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100069995 ◽

1978 ◽

Vol 36 (3) ◽

pp. 207-217

Author(s):

J.M. Cowley

Keyword(s):

Electron Microscope ◽

Crystal Structures ◽

Phase Contrast ◽

Crystal Defects ◽

Atom Density ◽

Lack Of Information ◽

Spatial Frequencies

The problem of "understandinq" electron microscope imaqes becomes more acute as the resolution is improved. The naive interpretation of an imaqe as representinq the projection of an atom density becomes less and less appropriate. We are increasinqly forced to face the complexities of coherent imaqinq of what are essentially phase objects. Most electron microscopists are now aware that, for very thin weakly scatterinq objects such as thin unstained bioloqical specimens, hiqh resolution imaqes are best obtained near the optimum defocus, as prescribed by Scherzer, where the phase contrast imaqe qives a qood representation of the projected potential, apart from a lack of information on the lower spatial frequencies. But phase contrast imaqinq is never simple except in idealized limitinq cases.

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X-Ray Replication of Submicrometer Linewidth Patterns

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100078250 ◽

1977 ◽

Vol 35 ◽

pp. 136-137

Author(s):

Henry I. Smith ◽

D.C. Flanders

Keyword(s):

Electron Beam Lithography ◽

Cross Sectional ◽

X Ray ◽

Electron Backscattering ◽

Spatial Frequencies ◽

Cross Sectional Profile ◽

Carbon Foils ◽

Sectional Profile ◽

And Control ◽

Soft Radiation

Scanning electron beam lithography has been used for a number of years to write submicrometer linewidth patterns in radiation sensitive films (resist films) on substrates. On semi-infinite substrates, electron backscattering severely limits the exposure latitude and control of cross-sectional profile for patterns having fundamental spatial frequencies below about 4000 Å(l),Recently, STEM'S have been used to write patterns with linewidths below 100 Å. To avoid the detrimental effects of electron backscattering however, the substrates had to be carbon foils about 100 Å thick (2,3). X-ray lithography using the very soft radiation in the range 10 - 50 Å avoids the problem of backscattering and thus permits one to replicate on semi-infinite substrates patterns with linewidths of the order of 1000 Å and less, and in addition provides means for controlling cross-sectional profiles. X-radiation in the range 4-10 Å on the other hand is appropriate for replicating patterns in the linewidth range above about 3000 Å, and thus is most appropriate for microelectronic applications (4 - 6).

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A simple way for producing holographic filters suitable for image improvement

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100108271 ◽

1978 ◽

Vol 36 (1) ◽

pp. 226-227

Author(s):

K.-H. Herrmann ◽

E. Reuber ◽

P. Schiske

Keyword(s):

Transfer Functions ◽

Diffraction Order ◽

Lateral Position ◽

Simple Method ◽

Spatial Frequencies ◽

Resolution Electron ◽

Wiener Filters ◽

Image Improvement ◽

Optical Reconstruction ◽

Set Up

Aposteriori deblurring of high resolution electron micrographs of weak phase objects can be performed by holographic filters [1,2] which are arranged in the Fourier domain of a light-optical reconstruction set-up. According to the diffraction efficiency and the lateral position of the grating structure, the filters permit adjustment of the amplitudes and phases of the spatial frequencies in the image which is obtained in the first diffraction order.In the case of bright field imaging with axial illumination, the Contrast Transfer Functions (CTF) are oscillating, but real. For different imageforming conditions and several signal-to-noise ratios an extensive set of Wiener-filters should be available. A simple method of producing such filters by only photographic and mechanical means will be described here.A transparent master grating with 6.25 lines/mm and 160 mm diameter was produced by a high precision computer plotter. It is photographed through a rotating mask, plotted by a standard plotter.

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New challenges to image processing posed by cryo-Electron microscopy of single particles

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100086416 ◽

1991 ◽

Vol 49 ◽

pp. 422-423

Author(s):

Joachim Frank

Keyword(s):

Electron Microscopy ◽

Phase Contrast ◽

Particle Orientation ◽

Single Particles ◽

Contrast Transfer Function ◽

Virtual Absence ◽

Cryo Electron Microscopy ◽

Spatial Frequencies ◽

New Challenges ◽

Particle Images

Compared with images of negatively stained single particle specimens, those obtained by cryo-electron microscopy have the following new features: (a) higher “signal” variability due to a higher variability of particle orientation; (b) reduced signal/noise ratio (S/N); (c) virtual absence of low-spatial-frequency information related to elastic scattering, due to the properties of the phase contrast transfer function (PCTF); and (d) reduced resolution due to the efforts of the microscopist to boost the PCTF at low spatial frequencies, in his attempt to obtain recognizable particle images.

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Right-Hemisphere Specialization for Contour Grouping

Experimental Psychology (formerly Zeitschrift für Experimentelle Psychologie) ◽

10.1027/1618-3169/a000252 ◽

2014 ◽

Vol 61 (5) ◽

pp. 331-339 ◽

Cited By ~ 1

Author(s):

Gregor Volberg

Keyword(s):

Right Hemisphere ◽

Contour Detection ◽

Global Processing ◽

Detection Accuracy ◽

Frequency Spectra ◽

Visual Hemifield ◽

Spatial Frequencies ◽

A Chain ◽

The Right ◽

Hemisphere Specialization

Previous studies often revealed a right-hemisphere specialization for processing the global level of compound visual stimuli. Here we explore whether a similar specialization exists for the detection of intersected contours defined by a chain of local elements. Subjects were presented with arrays of randomly oriented Gabor patches that could contain a global path of collinearly arranged elements in the left or in the right visual hemifield. As expected, the detection accuracy was higher for contours presented to the left visual field/right hemisphere. This difference was absent in two control conditions where the smoothness of the contour was decreased. The results demonstrate that the contour detection, often considered to be driven by lateral coactivation in primary visual cortex, relies on higher-level visual representations that differ between the hemispheres. Furthermore, because contour and non-contour stimuli had the same spatial frequency spectra, the results challenge the view that the right-hemisphere advantage in global processing depends on a specialization for processing low spatial frequencies.

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