Optical determination of O2(1Δg) quenching rates and relative emission intensities in high pressure oxygen gas using pulsed laser excitation at 1.064 μm

1984 ◽  
Vol 25 (2-4) ◽  
pp. 550-551 ◽  
Author(s):  
J.G. Parker
2010 ◽  
Vol 447-448 ◽  
pp. 61-65 ◽  
Author(s):  
Kei Kitamura ◽  
Toshiro K. Doi ◽  
Syuhei Kurokawa ◽  
Yoji Umezaki ◽  
Yoji Matsukawa ◽  
...  

We designed and manufactured a prototype of a unique CMP machine, which can perform double-side CMP simultaneously in a sealed and pressure container as regarding effective action of the processing atmosphere around workpieces as important. Polishing experiments with single crystal silicon (Si) wafers (100) are performed by charging the container with various gases. As a result, the removal rates increased by up to 25% under high pressure oxygen gas atmosphere.


1991 ◽  
Vol 185-189 ◽  
pp. 917-918 ◽  
Author(s):  
Y. Oda ◽  
A. Sumiyama ◽  
T. Kohara ◽  
M. Yamada ◽  
K. Asayama ◽  
...  

1995 ◽  
Vol 44 (5) ◽  
pp. 405-409 ◽  
Author(s):  
Yukiko IMAIZUMI ◽  
Sawako SUGIMOTO ◽  
Yoko KANAYAMA ◽  
Yoshiko ARIKAWA

1990 ◽  
Vol 165-166 ◽  
pp. 1663-1664 ◽  
Author(s):  
Yasukage Oda ◽  
Masaru Yamada ◽  
Kunisuke Asayama ◽  
Takao Kohara ◽  
Yoshihiro Yamada

2017 ◽  
Vol 31 (25) ◽  
pp. 1745010
Author(s):  
Chao Zhang ◽  
Hao Zhang ◽  
John Y. T. Wei

To examine the thermodynamic phase stability of Y–Ba–Cu–O superconductors in ultrathin film form, we study the effects of high-pressure oxygen annealing and Cu enrichment on YBa2Cu3O[Formula: see text] films ranging from 8 nm to 15 nm in thickness. The films are grown epitaxially on SrTiO3 substrates by pulsed laser-ablated deposition, and post-annealed in 475 atm of oxygen at 800[Formula: see text]C while subjected to varying concentrations of excess CuO. X-ray diffraction (XRD) on the annealed films shows evidence for suppression of YBa2Cu3O[Formula: see text] and formation of Y2Ba4Cu8O[Formula: see text]. This structural transformation towards a higher-oxidation phase is expectedly correlated with film thinness and Cu enrichment.


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