X-ray and neutron diffraction line broadening measurements in a martensitic steel for fusion technology

1995 ◽  
Vol 22 (1-2) ◽  
pp. 17-21 ◽  
Author(s):  
R. Coppola ◽  
P. Lukas ◽  
R. Montanari ◽  
F. Rustichelli ◽  
M. Vràna
Keyword(s):  
Neutron Diffraction ◽  
Martensitic Steel ◽  
Diffraction Line ◽  
Fusion Technology ◽  
Line Broadening ◽  
X Ray

Neutron-diffraction line broadening in a tempered martensitic steel for fusion reactors

1997 ◽  
Vol 241-243 ◽  
pp. 1261-1263 ◽  
Author(s):  
R. Coppola ◽  
P. Lukáš ◽  
P. Mikula ◽  
M. Vrána
Keyword(s):  
Neutron Diffraction ◽  
Martensitic Steel ◽  
Diffraction Line ◽  
Fusion Reactors ◽  
Line Broadening

Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

1994 ◽  
Vol 376 ◽  
Author(s):  
M. Vrána ◽  
P. Klimanek ◽  
T. Kschidock ◽  
P. Lukáš ◽  
P. Mikula
Keyword(s):  
High Resolution ◽  
Neutron Diffraction ◽  
Stacking Faults ◽  
Metallic Materials ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Neutron Diffractometer ◽  
Residual Strains ◽  
Good Agreement

ABSTRACTInvestigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite

2006 ◽  
Vol 54 (3) ◽  
pp. 390-401 ◽  
Author(s):  
Joaquin Bastida ◽  
Marek A. Kojdecki ◽  
Pablo Pardo ◽  
Pedro Amorós
Keyword(s):  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray

X-Ray Diffraction and Reflectometry Investigation of Interdiffusion In Sputtered Niobium-Tungsten Bilayers

1999 ◽  
Vol 562 ◽  
Author(s):  
U. Welzel ◽  
P. Lamparter ◽  
E. J. Mittemeijer
Keyword(s):  
Diffusion Coefficients ◽  
Low Temperatures ◽  
Qualitative Evaluation ◽  
Diffraction Line ◽  
Published Data ◽  
Concentration Profiles ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Bulk Materials ◽  
X Ray

ABSTRACTInterdiffusion in sputtered niobium(45nm)-tungsten(45nm) bilayers upon annealing at low temperatures (T<1000K) has been investigated using X-ray reflectometry and diffraction. The accompanying changes in macrostress and microstructure have been characterized by applying the X-ray diffraction sin2ψ T method and by qualitative evaluation of the diffraction line broadening, respectively. Annealing causes, besides interdiffusion, changes of macrostress and decrease of microstructural imperfection. Concentration profiles corresponding to diffusion lengths of only a few nanometers were determined by simulation of the measured reflectivity patterns. The values obtained for the diffusion coefficients are compared with corresponding values obtained by extrapolation from published data for bulk materials at much higher temperatures.

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