Analysis of a thin, silicon-oxide, silicon-nitride multilayer target by time-of-flight medium energy backscattering
1996 ◽
Vol 118
(1-4)
◽
pp. 556-559
◽
Keyword(s):
2000 ◽
Vol 18
(5)
◽
pp. 2503
◽
Keyword(s):
Keyword(s):
1993 ◽
Vol 64-65
◽
pp. 849-856
◽
Keyword(s):
Keyword(s):