Use of Kikuchi line intersections in crystal symmetry determination: application to chalcopyrite structure

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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A very rapid in situ Kikuchi technique to determine relative crystal misorientation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106211 ◽

1988 ◽

Vol 46 ◽

pp. 830-831

Author(s):

J. I. Bennetch

Keyword(s):

Electron Beam ◽

Analytical Techniques ◽

Superplastic Forming ◽

The Other ◽

Kikuchi Pattern ◽

Kikuchi Line ◽

Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

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Microstructure and crystal symmetry of Pb2Sr2(Y/Ca)Cu3O9−δ

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100173455 ◽

1990 ◽

Vol 48 (4) ◽

pp. 64-65

Author(s):

Y. P. Lin ◽

J. S. Xue ◽

J. E. Greedan

Keyword(s):

Electron Diffraction ◽

High Temperature Superconductors ◽

Carbon Film ◽

Basic Structure ◽

Crystal Symmetry ◽

X Ray Diffraction ◽

X Ray ◽

Space Groups ◽

New Family ◽

Convergent Beam

A new family of high temperature superconductors based on Pb2Sr2YCu3O9−δ has recently been reported. One method of improving Tc has been to replace Y partially with Ca. Although the basic structure of this type of superconductors is known, the detailed structure is still unclear, and various space groups has been proposed. In our work, crystals of Pb2Sr2YCu3O9−δ with dimensions up to 1 × 1 × 0.25.mm and with Tc of 84 K have been grown and their superconducting properties described. The defects and crystal symmetry have been investigated using electron microscopy performed on crushed crystals supported on a holey carbon film.Electron diffraction confirmed x-ray diffraction results which showed that the crystals are primitive orthorhombic with a=0.5383, b=0.5423 and c=1.5765 nm. Convergent Beam Electron Diffraction (CBED) patterns for the and axes are shown in Figs. 1 and 2 respectively.

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Infrared spectroscopic study of the YPO4-YCrO4 system

Collection of Czechoslovak Chemical Communications ◽

10.1135/cccc19852139 ◽

1985 ◽

Vol 50 (10) ◽

pp. 2139-2145

Author(s):

Alexander Muck ◽

Eva Šantavá ◽

Bohumil Hájek

Keyword(s):

Spectroscopic Study ◽

Infrared Spectra ◽

Point Of View ◽

Mixed Crystals ◽

Crystal Symmetry ◽

Infrared Spectroscopic Study ◽

X Ray Diffraction ◽

X Ray ◽

Infrared Spectroscopic ◽

Diffraction Patterns

The infrared spectra and powder X-ray diffraction patterns of polycrystalline YPO4-YCrO4 samples are studied from the point of view of their crystal symmetry. Mixed crystals of the D4h19 symmetry are formed over the region of 0-30 mol.% YPO4 in YCrO4. The Td → D2d → D2 or C2v(GS eff) correlation is appropriate for both PO43- and CrO43- anions.

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Crystal symmetry breaking in few-quintuple Bi2Te3 films: Applications in nanometrology of topological insulators

Applied Physics Letters ◽

10.1063/1.3396190 ◽

2010 ◽

Vol 96 (15) ◽

pp. 153103 ◽

Cited By ~ 130

Author(s):

K. M. F. Shahil ◽

M. Z. Hossain ◽

D. Teweldebrhan ◽

A. A. Balandin

Keyword(s):

Symmetry Breaking ◽

Topological Insulators ◽

Crystal Symmetry

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Effect of oxygen vacancies and crystal symmetry on piezocatalytic properties of Bi2WO6 ferroelectric nanosheets for wastewater decontamination

Environmental Science Nano ◽

10.1039/d1en00022e ◽

2021 ◽

Author(s):

Zihan Kang ◽

Enzhu Lin ◽

Ni Qin ◽

Jiang Wu ◽

Baowei Yuan ◽

...

Keyword(s):

Organic Pollutants ◽

Oxygen Vacancies ◽

Mechanical Energy ◽

Crystal Symmetry ◽

Characteristic P ◽

Novel Technique ◽

Effect Of Oxygen

Piezocatalysis emerged as a novel technique to make use of mechanical energy in dealing with organic pollutants in wastewater. In this work, the ferroelectric Bi2WO6 (BWO) nanosheets with a characteristic...

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DEPOSITION OF SINGLE-PHASE CuInSe2 THIN FILMS UNDER LOW VACUUM LEVEL BY A TWO-STAGE GROWTH TECHNIQUE

Surface Review and Letters ◽

10.1142/s0218625x09012755 ◽

2009 ◽

Vol 16 (03) ◽

pp. 381-386 ◽

Cited By ~ 1

Author(s):

J. B. CHU ◽

H. B. ZHU ◽

Z. A. WANG ◽

Z. Q. BIAN ◽

Z. SUN ◽

...

Keyword(s):

Solar Cells ◽

Single Phase ◽

Low Cost ◽

Control Process ◽

Rf Magnetron Sputtering ◽

Chalcopyrite Structure ◽

Sputtering Deposition ◽

Vacuum Level ◽

X Ray ◽

High Efficient

Single-phase CuInSe 2 films were grown by high vapor selenization of CuIn alloy precursors within a partially closed graphite box. The CuIn precursors were prepared using Cu x In y alloy targets with different composition rates under low vacuum level by a homemade sputtering system. The Cu and In composition rates of the used targets are 11:9, 10:10, and 9:11, respectively. The metallic precursor films were selenized using a two-step temperature profile, i.e. at 250°C and 400–500°C, respectively. The influence of the temperature at the second selenization step on the quality of the CIS absorbing layers was investigated. The CIS films were characterized by X-ray diffractometry, scanning electron microscopy, energy dispersive X-ray analysis, and Raman spectroscopy. The deposited CIS absorbers selenized at a high temperature of 500°C for 30 min exhibited a single-phase chalcopyrite structure with a preferential orientation in the (112) direction. These layers display uniform, large, and densely packed crystals with a grain size of about 3–5 μm. Cadmium sulfide buffer layer was manufactured by chemical bath deposition method. Bilayers ZnO / ZnO : Al were prepared by RF magnetron sputtering deposition. CIS solar cells with an efficiency of about 6.5% were produced without antireflective films. The method to fabricate CIS solar cells by a combination of the low vacuum sputtering deposition and the graphite box selenization process has provided a simple control process and shown a promising potential for developing high efficient and low-cost CuInSe 2 solar cells.

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