Langmuir probe measurements of electron temperature and electron density behind the skimmer of an inductively coupled plasma mass spectrometer
1991 ◽
Vol 46
(6-7)
◽
pp. 805-817
◽
1988 ◽
Vol 43
(3)
◽
pp. 273-285
◽
1994 ◽
Vol 49
(12-14)
◽
pp. 1283-1303
◽
Langmuir probe measurements in a low pressure inductively coupled plasma used for diamond deposition
1999 ◽
Vol 17
(3)
◽
pp. 721-725
◽
1989 ◽
Vol 44
(10)
◽
pp. 989-998
◽
1995 ◽
Vol 50
(10)
◽
pp. 1247-1261
◽
2002 ◽
Vol 20
(3)
◽
pp. 919-927
◽
2001 ◽
Vol 10
(2)
◽
pp. 191-204
◽