Software is a complex entity, and its development needs careful planning and a high amount of time and cost. To assess quality of program, software measures are very helpful. Amongst the existing measures, coupling is an important design measure, which computes the degree of interdependence among the entities of a software system. Higher coupling leads to cognitive complexity and thus a higher probability occurrence of faults. Well in time prediction of fault-prone modules assists in saving time and cost of testing. This paper aims to capture important aspects of coupling and then assess the effectiveness of these aspects in determining fault-prone entities in the software system. We propose two coupling metrics, i.e., Vovel-in and Vovel-out, that capture the level of coupling and the volume of information flow. We empirically evaluate the effectiveness of the Vovel metrics in determining the fault-prone classes using five projects, i.e., Eclipse JDT, Equinox framework, Apache Lucene, Mylyn, and Eclipse PDE UI. Model building is done using univariate logistic regression and later Spearman correlation coefficient is computed with the existing coupling metrics to assess the coverage of unique information. Finally, the least correlated metrics are used for building multivariate logistic regression with and without the use of Vovel metrics, to assess the effectiveness of Vovel metrics. The results show the proposed metrics significantly improve the predicting of fault prone classes. Moreover, the proposed metrics cover a significant amount of unique information which is not covered by the existing well-known coupling metrics, i.e., CBO, RFC, Fan-in, and Fan-out. This paper, empirically evaluates the impact of coupling metrics, and more specifically the importance of level and volume of coupling in software fault prediction. The results advocate the prudent addition of proposed metrics due to their unique information coverage and significant predictive ability.
Vovel metrics—novel coupling metrics for improved software fault prediction
