Determination of optical properties in nanostructured thin films using the Swanepoel method

2006 ◽  
Vol 252 (17) ◽  
pp. 6013-6017 ◽  
Author(s):  
J. Sánchez-González ◽  
A. Díaz-Parralejo ◽  
A.L. Ortiz ◽  
F. Guiberteau
2019 ◽  
Vol 569 ◽  
pp. 14-19 ◽  
Author(s):  
Uğur Demirkol ◽  
Suat Pat ◽  
Reza Mohammadigharehbagh ◽  
Caner Musaoğlu ◽  
Mustafa Özgür ◽  
...  

1990 ◽  
Vol 192 ◽  
Author(s):  
G. Amato ◽  
L. Boarino ◽  
F. Fizzotti ◽  
C. Manfredotti

ABSTRACTWe propose to apply a new method to model the optical response of amorphous silicon thin films. This method presents the advantage of having a good physical insight. On the other hand, although the model has been originally tested on different materials like a-Si, a-Ge and a-GaAs, we show that it is also sensitive to small differences like those that can exist between intrinsic and doped a-Si:H.


2017 ◽  
Vol 19 (23) ◽  
pp. 15084-15097 ◽  
Author(s):  
Sundar Kunwar ◽  
Mao Sui ◽  
Puran Pandey ◽  
Quanzhen Zhang ◽  
Ming-Yu Li ◽  
...  

Semi-spherical and irregular Pd nanoparticles and voids are fabricated on sapphire(0001) by the solid-state dewetting of sputter-deposited Pd thin films at different thickness and temperature. The structural evolution, surface morphology transformation and optical properties of Pd nanostructures are probed.


2016 ◽  
Vol 1141 ◽  
pp. 51-53
Author(s):  
Chetan Zankat ◽  
V.M. Pathak ◽  
Pratik Pataniya ◽  
G.K. Solanki ◽  
K.D. Patel ◽  
...  

Amorphous SnSe thin films were deposited by thermal evaporation technique on glass substrates kept at room temperature in a vacuum better than 10-5Torr. A detailed study of structural and optical properties of 150 nm thin film was carried out. The selected area diffraction patterns obtained by TEM for this thin film were analyzed by a new method that involves accurate determination of lattice parameters by image processing software. The obtained results are in good agreement with the JCPDS data. Optical transmission spectra obtained at room temperature were analyzed to study optical properties of deposited thin films. It has been found that indirect carrier transition is responsible for optical absorption process in the deposited thin films.


2004 ◽  
Vol 264-268 ◽  
pp. 553-556
Author(s):  
Maria Crışan ◽  
Măriuca Gartner ◽  
L. Predoana ◽  
D. Crışan ◽  
R. Scurtu ◽  
...  

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