Towards quantitative chemical imaging with ToF-SIMS

2008 ◽  
Vol 255 (4) ◽  
pp. 992-996 ◽  
Author(s):  
Matthew S. Wagner
2021 ◽  
Author(s):  
Cecile COURREGES ◽  
Mélanie Bonnecaze ◽  
Delphine Flahaut ◽  
Sophie Nolivos ◽  
Regis Grimaud ◽  
...  

A chemical fingerprint of Escherichia coli cells surface labeled by gelatin coated gold nanoparticles was obtained by combining Auger Electron Spectroscopy (AES) for single cell level chemical images, and Time-of-Flight...


2019 ◽  
Vol 34 (6) ◽  
pp. 1098-1108 ◽  
Author(s):  
Pietro Benettoni ◽  
Hryhoriy Stryhanyuk ◽  
Stephan Wagner ◽  
Felix Kollmer ◽  
Jairo H. Moreno Osorio ◽  
...  

ToF-SIMS boundaries were pushed to enhance lateral resolution and mass resolving power for chemical imaging of nanoparticles in biological systems.


Author(s):  
Steven J. Pachuta

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has in recent years become a useful tool for surface analysis in industrial laboratories. All elements and isotopes, as well as many molecular entities, can be detected by SIMS, with most of the signal coming from the outer 10 - 20 Å of the surface. The initial penetration of TOF-SIMS into industry was as an improvement over existing quadrupole instruments, with higher mass range, mass resolution, and sensitivity. The coupling of TOF-SIMS with high brightness liquid metal ion sources greatly expanded the applicability of the technique, making chemical imaging of the outermost monolayers of a surface a routine experiment.Several examples will be presented of TOF-SIMS imaging applied to real-world materials encountered in an industrial analytical laboratory. All results were obtained from a PHI-Evans TFS series instrument equipped with an FEI two-lens 69Ga+ liquid metal ion gun (LMIG). When operated at 25 keV beam energy, a primary ion beam diameter of 2500 Å in continuous mode, and 1-2 μm in pulsed mode, can routinely be obtained.


Hyomen Kagaku ◽  
2016 ◽  
Vol 37 (12) ◽  
pp. 599-603
Author(s):  
Dan AOKI ◽  
Yasuyuki MATSUSHITA ◽  
Kazuhiko FUKUSHIMA

2013 ◽  
Vol 85 (22) ◽  
pp. 10820-10828 ◽  
Author(s):  
Francesco Masia ◽  
Adam Glen ◽  
Phil Stephens ◽  
Paola Borri ◽  
Wolfgang Langbein

PLoS ONE ◽  
2009 ◽  
Vol 4 (10) ◽  
pp. e7408 ◽  
Author(s):  
François Le Naour ◽  
Marie-Pierre Bralet ◽  
Delphine Debois ◽  
Christophe Sandt ◽  
Catherine Guettier ◽  
...  

Author(s):  
A. Ourmazd ◽  
F.H. Baumann ◽  
M. Bode ◽  
Y. Kim

Quantitative Chemical Mapping is an electron microscopic technique capable of revealing compositional variations in crystalline materials. It combines chemical lattice imaging which maps the sample composition, with vector pattern recognition, which quantifies the local information content of the image to measure the local sample composition. Here we briefly address the spatial resolution of this technique, assuming complete familiarity with its theoretical underpinnings.In chemical imaging, we are concerned with the way that a compositional inhomogeneity is imaged under conditions appropriate for chemical sensitivity, and how the pattern recognition algorithm extracts information from a chemical lattice image. The problem can be formulated as follows. Given a “chemical impulse” of a specific shape, such as a column of Al atoms imbedded in GaAs (approximating a δ-function), an abrupt interface (a θ-function), or a diffuse interface (e.g., with an error function profile), what is the shape of the impulse on the analyzed chemical image? Or, alternatively, what region of the sample contributes to the information content of an image unit cell? By reciprocity, these two formulations are equivalent.


2006 ◽  
Vol 1 (1) ◽  
pp. 63-75 ◽  
Author(s):  
Robert P. Cogdill ◽  
Steven M. Short ◽  
Ryanne Forcht ◽  
Zhenqi Shi ◽  
Yaochun Shen ◽  
...  

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