Spatially selective biomolecules immobilization on silicon nitride waveguides through contact printing onto plasma treated photolithographic micropattern: Step-by-step analysis with TOF-SIMS chemical imaging

2020 ◽  
Vol 506 ◽  
pp. 145002 ◽  
Author(s):  
Katarzyna Gajos ◽  
Andrzej Budkowski ◽  
Panagiota Petrou ◽  
Kamil Awsiuk ◽  
Konstantinos Misiakos ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Chemical Imaging ◽  
Contact Printing ◽  
Tof Sims

scholarly journals AES and ToF-SIMS combination for single cell chemical imaging of gold nanoparticle-labeled Escherichia coli

2021 ◽  
Author(s):  
Cecile COURREGES ◽  
Mélanie Bonnecaze ◽  
Delphine Flahaut ◽  
Sophie Nolivos ◽  
Regis Grimaud ◽  
...  
Keyword(s):  
Escherichia Coli ◽  
Gold Nanoparticles ◽  
Single Cell ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Chemical Imaging ◽  
Single Cell Level ◽  
Cell Level ◽  
Tof Sims ◽  
Escherichia Coli Cells

A chemical fingerprint of Escherichia coli cells surface labeled by gelatin coated gold nanoparticles was obtained by combining Auger Electron Spectroscopy (AES) for single cell level chemical images, and Time-of-Flight...

scholarly journals Identification of nanoparticles and their localization in algal biofilm by 3D-imaging secondary ion mass spectrometry

2019 ◽  
Vol 34 (6) ◽  
pp. 1098-1108 ◽  
Author(s):  
Pietro Benettoni ◽  
Hryhoriy Stryhanyuk ◽  
Stephan Wagner ◽  
Felix Kollmer ◽  
Jairo H. Moreno Osorio ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
3D Imaging ◽  
Secondary Ion Mass Spectrometry ◽  
Biological Systems ◽  
Chemical Imaging ◽  
Resolving Power ◽  
Tof Sims ◽  
Mass Resolving Power ◽  
Algal Biofilm ◽  
Secondary Ion

ToF-SIMS boundaries were pushed to enhance lateral resolution and mass resolving power for chemical imaging of nanoparticles in biological systems.

Industrial applications of TOF-SIMS imaging

1996 ◽  
Vol 54 ◽  
pp. 1040-1041
Author(s):  
Steven J. Pachuta
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Mass Range ◽  
Chemical Imaging ◽  
Industrial Applications ◽  
Beam Diameter ◽  
Tof Sims ◽  
Initial Penetration

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has in recent years become a useful tool for surface analysis in industrial laboratories. All elements and isotopes, as well as many molecular entities, can be detected by SIMS, with most of the signal coming from the outer 10 - 20 Å of the surface. The initial penetration of TOF-SIMS into industry was as an improvement over existing quadrupole instruments, with higher mass range, mass resolution, and sensitivity. The coupling of TOF-SIMS with high brightness liquid metal ion sources greatly expanded the applicability of the technique, making chemical imaging of the outermost monolayers of a surface a routine experiment.Several examples will be presented of TOF-SIMS imaging applied to real-world materials encountered in an industrial analytical laboratory. All results were obtained from a PHI-Evans TFS series instrument equipped with an FEI two-lens 69Ga+ liquid metal ion gun (LMIG). When operated at 25 keV beam energy, a primary ion beam diameter of 2500 Å in continuous mode, and 1-2 μm in pulsed mode, can routinely be obtained.

scholarly journals Chemical Imaging of Plant Samples by Cryo-TOF-SIMS

Hyomen Kagaku ◽  
2016 ◽  
Vol 37 (12) ◽  
pp. 599-603
Author(s):  
Dan AOKI ◽  
Yasuyuki MATSUSHITA ◽  
Kazuhiko FUKUSHIMA
Keyword(s):  
Chemical Imaging ◽  
Tof Sims ◽  
Plant Samples

scholarly journals Chemical Imaging on Liver Steatosis Using Synchrotron Infrared and ToF-SIMS Microspectroscopies

PLoS ONE ◽  
2009 ◽  
Vol 4 (10) ◽  
pp. e7408 ◽  
Author(s):  
François Le Naour ◽  
Marie-Pierre Bralet ◽  
Delphine Debois ◽  
Christophe Sandt ◽  
Catherine Guettier ◽  
...  
Keyword(s):  
Liver Steatosis ◽  
Chemical Imaging ◽  
Tof Sims

Interfacial Micropore Defect Formation in PEDOT:PSS-Si Hybrid Solar Cells Probed by TOF-SIMS 3D Chemical Imaging

2013 ◽  
Vol 85 (14) ◽  
pp. 6840-6845 ◽  
Author(s):  
Joseph P. Thomas ◽  
Liyan Zhao ◽  
Marwa Abd-Ellah ◽  
Nina F. Heinig ◽  
K. T. Leung
Keyword(s):  
Solar Cells ◽  
Defect Formation ◽  
Chemical Imaging ◽  
Hybrid Solar Cells ◽  
Tof Sims
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