Surface mechanical property and residual stress of peened nickel-aluminum bronze determined by in-situ X-ray diffraction

2017 ◽  
Vol 420 ◽  
pp. 28-33 ◽  
Author(s):  
Chengxi Wang ◽  
Chuanhai Jiang ◽  
Yuantao Zhao ◽  
Ming Chen ◽  
Vincent Ji
Keyword(s):  
Mechanical Property ◽  
Residual Stress ◽  
Aluminum Bronze ◽  
Nickel Aluminum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nickel Aluminum Bronze

scholarly journals Evolution of the Corrosion Product Film on Nickel-Aluminum Bronze and Its Corrosion Behavior in 3.5 wt % NaCl Solution

Materials ◽  
2019 ◽  
Vol 12 (2) ◽  
pp. 209 ◽  
Author(s):  
Yang Ding ◽  
Rong Zhao ◽  
Zhenbo Qin ◽  
Zhong Wu ◽  
Liqiang Wang ◽  
...  
Keyword(s):  
Corrosion Product ◽  
Aluminum Bronze ◽  
Protective Film ◽  
Nickel Aluminum ◽  
Nacl Solution ◽  
Corrosion Attack ◽  
Corrosion Product Film ◽  
Product Film ◽  
Nickel Aluminum Bronze

The in-situ studies of the corrosion product film on nickel-aluminum bronze are significant for explaining the mechanism of its corrosion resistance. In this paper, the corrosion behavior of nickel-aluminum bronze and the formation process of the protective film in 3.5 wt % NaCl solution are systematically investigated. The results of scanning electron microscope analysis and electrochemical tests indicate that the corrosion resistance of nickel-aluminum bronze is improved due to the formation of the corrosion product film. The change of local electrochemical property on the corrosion product film during the immersion time is evaluated via in-situ scanning vibrating electrode technique, and it reveals the evolution rules of ionic flux in real time. The formation process of the protective film on different phases in nickel-aluminum bronze is observed directly by in-situ atomic force microscopy as height change measurements. The α phases at different locations present different corrosion behaviors, and the lamellar α phase within the α + κIII eutectoid structure gets more serious corrosion attack. The κ phases establish a stable and dense protective film in short time, preventing the corrosion attack effectively. The β′ phase, however, suffers the most serious corrosion damage until a protective film is formed after 150 min of immersion.

Thermal Residual Stress Relaxation in Sputtered ZnO Film on (100) Si Substrate Studied In Situ by Synchrotron X-Ray Diffraction

2011 ◽  
Vol 681 ◽  
pp. 127-132
Author(s):  
Christopher Krauss ◽  
Guillaume Geandier ◽  
Florine Conchon ◽  
Pierre Olivier Renault ◽  
Eric Le Bourhis ◽  
...  
Keyword(s):  
Residual Stress ◽  
Stress Relaxation ◽  
Structural Changes ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Si Substrates ◽  
Compressive Stresses ◽  
Residual Stress Relaxation

Residual stress relaxation in sputtered ZnO films has been studied in-situ by synchrotron x-ray diffraction. The films deposited on (001) Si substrates were thermally treated from 25°C to 700°C. X-ray diffraction 2D patterns were captured continuously during the heating, plateau and cooling ramps. The corrections carried out for compensating the furnace drift are discussed. We first observe an increase of the intrinsic compressive stresses before stress relaxation starts to operate around 370°C. Then, thermal contraction upon cooling dominates so that overall, the large initial compressive film stresses turn to tensile after thermal treatment. The overall behaviour is discussed in terms of structural changes induced by the heat treatment.

In situ thermal residual stress evolution in ultrathin ZnO and Ag films studied by synchrotron x-ray diffraction

2011 ◽  
Vol 520 (5) ◽  
pp. 1390-1394 ◽  
Author(s):  
P.O. Renault ◽  
C. Krauss ◽  
E. Le Bourhis ◽  
G. Geandier ◽  
A. Benedetto ◽  
...  
Keyword(s):  
Residual Stress ◽  
Thermal Residual Stress ◽  
Stress Evolution ◽  
X Ray Diffraction ◽  
X Ray

ON THE MEASUREMENT AND INTERPRETATION OF RESIDUAL STRESS AT THE MICRO-SCALE

2010 ◽  
Vol 24 (01n02) ◽  
pp. 1-9 ◽  
Author(s):  
ALEXANDER M. KORSUNSKY ◽  
EDOARDO BEMPORAD ◽  
MARCO SEBASTIANI ◽  
FELIX HOFMANN ◽  
SARAANSH DAVE
Keyword(s):  
Residual Stress ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
X Ray Diffraction ◽  
Strain Relief ◽  
X Ray ◽  
Micro Scale ◽  
Digital Correlation ◽  
Non Destructive

In the present paper we consider two representative methods for residual stress evaluation at the micro-scale: a (semi-)destructive method involving material removal and the measurement of strain relief; and a non-destructive X-ray diffraction technique involving the use of micro-focused synchrotron X-ray beam. A recently developed strain relief approach is described using a Focused Ion Beam (FIB) to create a circular trench of progressively increasing depth around a circular "island". Residual stress is evaluated by the comparison of the strain relief (measured by digital correlation of displacements or strains) with Finite Element simulations. The technique is illustrated for a thin TiN coating layer. The second approach uses focused synchrotron X-ray beams for white beam Laue diffraction. Demonstration experiments described involve in situ loading of commercially pure nickel foil. Procedures for validation and improvement of accuracy are discussed.

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