Residual stress determination in thin films by X-ray diffraction and the widespread analytical practice applying a biaxial stress model: An outdated oversimplification?

2020 ◽  
pp. 148531
Author(s):  
Peter Schoderböck ◽  
Harald Köstenbauer
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Biaxial Stress ◽  
Stress Model ◽  
Stress Determination ◽  
X Ray Diffraction ◽  
Residual Stress Determination ◽  
X Ray ◽  
Analytical Practice

Residual stress determination by X-ray diffraction in tungsten thin films

1993 ◽  
Vol 65-66 ◽  
pp. 99-105 ◽  
Author(s):  
K.F. Badawi ◽  
A. Naudon ◽  
Ph. Goudeau
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Stress Determination ◽  
X Ray Diffraction ◽  
Residual Stress Determination ◽  
X Ray

scholarly journals Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys

2017 ◽  
Vol 122 (19) ◽  
pp. 195105 ◽  
Author(s):  
Mathieu Guerain ◽  
Jean-Luc Grosseau-Poussard ◽  
Guillaume Geandier ◽  
Benoit Panicaud ◽  
Nobumichi Tamura ◽  
...  
Keyword(s):  
Residual Stress ◽  
Raman Spectroscopy ◽  
Metallic Alloys ◽  
Stress Determination ◽  
X Ray Diffraction ◽  
Length Scales ◽  
Oxide Layers ◽  
Residual Stress Determination ◽  
X Ray

Aspects of Residual Stress Determination Using Energy-Dispersive Synchrotron X-Ray Diffraction

2006 ◽  
Vol 524-525 ◽  
pp. 267-272 ◽  
Author(s):  
Axel Steuwer ◽  
Matthew J. Peel ◽  
Thomas Buslaps
Keyword(s):  
Residual Stress ◽  
Energy Dispersive ◽  
Stress Determination ◽  
X Ray Diffraction ◽  
Residual Stress Determination ◽  
X Ray ◽  
Gauge Volume ◽  
Diffraction Angle ◽  
Instrumental Resolution ◽  
Very High

In this paper we discuss certain aspects of residual stress measurements using energy-dispersive synchrotron X-ray diffraction using very high X-ray energies in the range up to 200keV. In particular, we focus on the strain resolution and its relation to the geometric contribution to the instrumental resolution. This energy range together with the brilliance of insertion devices allows measurements in bulk materials with penetration approaching those of neutrons, and the technique is demonstrated to have a high potential for residual stress determination. However, the use of high X-ray energies implies a relatively small diffraction angle and in turn a relatively elongated gauge volume, which favours the application of the technique to essentially 2D problems.

Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method

2010 ◽  
Vol 43 ◽  
pp. 569-572
Author(s):  
Ai Xin Feng ◽  
Huai Yang Sun ◽  
Yu Peng Cao ◽  
Chuan Chao Xu ◽  
Gui Fen Ni ◽  
...  
Keyword(s):  
Experimental Data ◽  
Residual Stress ◽  
Principal Stress ◽  
Analysis Method ◽  
Stress Determination ◽  
X Ray Diffraction ◽  
Residual Stress Determination ◽  
X Ray ◽  
Single Stress ◽  
The Relationship

Residual stress determination by X-ray diffraction is theoretically analyzed. Using stress of two directions analysis method, the magnitude and direction of the principal stress which is induced by laser shocked wave can be calculated. The results indicate that the calculated value consists with that of the experimental data, which shows that the surface stresses state comprehensively. Meanwhile, the relationship between the principle stress and single stress with different energies are analyzed.

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