Atomic-scale characterization of highly doped Si impurities in GaAs using scanning tunneling microscopy

2022 ◽  
pp. 152373
Author(s):  
Nobuyuki Ishida ◽  
Takaaki Mano ◽  
Takeshi Noda
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Scale Characterization

Atomic-scale Characterization of HF-treated 4H-SiC(0001)1×1 Surfaces by Scanning Tunneling Microscopy

2007 ◽  
Vol 996 ◽  
Author(s):  
Kenta Arima ◽  
Hideyuki Hara ◽  
Yasuhisa Sano ◽  
Keita Yagi ◽  
Ryota Okamoto ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Chemical Preparation ◽  
Local Structures ◽  
Wet Chemical ◽  
Low Energy Electron ◽  
Scale Characterization

AbstractScanning tunneling microscopy (STM) observations are performed on 4H-SiC(0001) surfaces after wet-chemical preparation steps including HF treatments.1×1 structures are formed on a terrace together with other local structures. Their atomic images are investigated in conjunction with low-energy electron diffraction and electron spectroscopy for chemical analysis. It is suggested that each bright dot forming the 1×1 phase corresponds to an OH-terminated Si atom.

Atomic Scale Characterization of (NH4)2Sx-Treated GaAs (100) Surface

1994 ◽  
Vol 332 ◽  
Author(s):  
Naoki Yokoi ◽  
Hiroya Andoh ◽  
Mikio Takai
Keyword(s):  
Surface Region ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Ion Scattering ◽  
Tunneling Microscopy ◽  
Xps Spectra ◽  
Sulfur Layer ◽  
Scale Characterization ◽  
Medium Energy Ion Scattering

ABSTRACTThe geometric structure of GaAs (100) surfaces, treated in a (NH4)2Sx solution and annealed in N2 environment, has been studied in an atomic scale using high-resolution Rutherford backscattering (RBS), X-ray photoemission spectroscopy (XPS) and scanning tunneling microscopy (STM). RBS analysis using medium energy ion scattering (MEIS) could provide the thickness of the sulfur layer on the GaAs surface of about 1.5 monolayers. RBS channeling spectra indicated that the disorder of atoms in the surface region of S-terminated samples was smaller than that of untreated one. XPS spectra showed that S atoms on the surface bonded only As atoms. STM observation revealed that S atoms had a periodicity of 4 Å corresponding to that of Ga or As atoms in the (100) plane.

scholarly journals Atomic-Scale Characterization of Droplet Epitaxy Quantum Dots

Nanomaterials ◽  
2021 ◽  
Vol 11 (1) ◽  
pp. 85
Author(s):  
Raja S. R. Gajjela ◽  
Paul M. Koenraad
Keyword(s):  
Quantum Dots ◽  
Optoelectronic Devices ◽  
Atomic Scale ◽  
Droplet Epitaxy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Etch Pits ◽  
Cross Sectional ◽  
Scale Characterization

The fundamental understanding of quantum dot (QD) growth mechanism is essential to improve QD based optoelectronic devices. The size, shape, composition, and density of the QDs strongly influence the optoelectronic properties of the QDs. In this article, we present a detailed review on atomic-scale characterization of droplet epitaxy quantum dots by cross-sectional scanning tunneling microscopy (X-STM) and atom probe tomography (APT). We will discuss both strain-free GaAs/AlGaAs QDs and strained InAs/InP QDs grown by droplet epitaxy. The effects of various growth conditions on morphology and composition are presented. The efficiency of methods such as flushing technique is shown by comparing with conventional droplet epitaxy QDs to further gain control over QD height. A detailed characterization of etch pits in both QD systems is provided by X-STM and APT. This review presents an overview of detailed structural and compositional analysis that have assisted in improving the fabrication of QD based optoelectronic devices grown by droplet epitaxy.

Imaging of Cracks in Semiconductor Surfaces Using Scanning Tunneling Microscopy

1990 ◽  
Vol 209 ◽  
Author(s):  
T. Foecke ◽  
R. King ◽  
A. Dale ◽  
W.W. Gerberich
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Crack Tip ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Cleavage Crack ◽  
Tunneling Microscopy ◽  
Transmission Electron ◽  
High Resolution Images ◽  
Dynamic Growth ◽  
Scale Characterization

ABSTRACTScanning Tunneling Microscopy (STM) has developed into a useful tool for atomic-scale characterization of material surfaces. It is proving especially useful in the field of fracture, as the vast majority of high-resolution images of fracture processes are made in the transmission electron microscope, where thin film effects and sample preparation may greatly modify crack tip stresses and dislocation structures. This investigation involved imaging of cracks introduced in Si at room temperature and single crystals of galena (PbS) by rapid indentation at 77K. Images were obtained at the arrested cracktip, around the indentation, and along the flanks of the crack in the dynamic growth region. Measurements were made of both crack-tip morphology and upsets observed along the flanks of the cracks in PbS. Interesting results concerning crack tip geometry in Si, the effect of STM tip geometry and scan conditions on the resulting image of the cleavage crack, as well as work in progress on other material systems, will be discussed.

Scanning tunneling microscopy of polymers: A status report

1989 ◽  
Vol 47 ◽  
pp. 330-331
Author(s):  
P.E. Russell ◽  
I.H. Musselman
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Sample Surface ◽  
Atomic Scale ◽  
Constant Current ◽  
Scanning Tunneling ◽  
Status Report ◽  
Tunneling Microscopy ◽  
Research Issues ◽  
Wide Range

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.

Scanning Tunneling Microscopy of Amorphous Carbon Films

1990 ◽  
Vol 48 (1) ◽  
pp. 318-319
Author(s):  
Mircea Fotino ◽  
D.C. Parks
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Amorphous Carbon ◽  
Carbon Films ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Amorphous Carbon Films ◽  
Image Optimization ◽  
Step Procedure ◽  
Stm Images

In the last few years scanning tunneling microscopy (STM) has made it possible and easily accessible to visualize surfaces of conducting specimens at the atomic scale. Such performance allows the detailed characterization of surface morphology in an increasing spectrum of applications in a wide variety of fields. Because the basic imaging process in STM differs fundamentally from its equivalent in other well-established microscopies, good understanding of the imaging mechanism in STM enables one to grasp the correct information content in STM images. It thus appears appropriate to explore by STM the structure of amorphous carbon films because they are used in many applications, in particular in the investigation of delicate biological specimens that may be altered through the preparation procedures.All STM images in the present study were obtained with the commercial instrument Nanoscope II (Digital Instruments, Inc., Santa Barbara, California). Since the importance of the scanning tip for image optimization and artifact reduction cannot be sufficiently emphasized, as stressed by early analyses of STM image formation, great attention has been directed toward adopting the most satisfactory tip geometry. The tips used here consisted either of mechanically sheared Pt/Ir wire (90:10, 0.010" diameter) or of etched W wire (0.030" diameter). The latter were eventually preferred after a two-step procedure for etching in NaOH was found to produce routinely tips with one or more short whiskers that are essentially rigid, uniform and sharp (Fig. 1) . Under these circumstances, atomic-resolution images of cleaved highly-ordered pyro-lytic graphite (HOPG) were reproducibly and readily attained as a standard criterion for easily recognizable and satisfactory performance (Fig. 2).

scholarly journals Incorporation of Bi atoms in InP studied at the atomic scale by cross-sectional scanning tunneling microscopy

2017 ◽  
Vol 1 (3) ◽  
Author(s):  
C. M. Krammel ◽  
M. Roy ◽  
F. J. Tilley ◽  
P. A. Maksym ◽  
L. Y. Zhang ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Cross Sectional

Atomic-scale surface science phenomena studied by scanning tunneling microscopy

2009 ◽  
Vol 603 (10-12) ◽  
pp. 1315-1327 ◽  
Author(s):  
F. Besenbacher ◽  
J.V. Lauritsen ◽  
T.R. Linderoth ◽  
E. Lægsgaard ◽  
R.T. Vang ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Science ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Scale Surface
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