Detecting the time and location of cracks using electrically conductive surfaces

2011 ◽  
Vol 33 (1) ◽  
pp. 116-123 ◽  
Author(s):  
Mohammad Pour-Ghaz ◽  
Jason Weiss
Author(s):  
Phutri Milana ◽  
Veinardi Suendo ◽  
Tika Pebriani ◽  
Fry Voni Steky ◽  
Didi Prasetyo Benu ◽  
...  

It is essential to realize a Raman measurement technique without artifact or fluorescence signals for high-quality and reliable data in a valid molecular-level analysis and interpretation. This requirement applies especially...


Nanoscale ◽  
2019 ◽  
Vol 11 (19) ◽  
pp. 9580-9586 ◽  
Author(s):  
Jong Uk Kim ◽  
Suwan Jeon ◽  
Minsung Heo ◽  
Hwi-Min Kim ◽  
Reehyang Kim ◽  
...  

Near atomically flat, chemically homogeneous, and electrically conductive surfaces with hidden dielectric cavities functioning as new type of optical metasurfaces.


Metals ◽  
2012 ◽  
Vol 2 (4) ◽  
pp. 450-477 ◽  
Author(s):  
Jian Song ◽  
Liangliang Wang ◽  
Andre Zibart ◽  
Christian Koch

Author(s):  
K. A. Fisher ◽  
M. G. L. Gustafsson ◽  
M. B. Shattuck ◽  
J. Clarke

The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).


Author(s):  
J. T. Woodward ◽  
J. A. N. Zasadzinski

The Scanning Tunneling Microscope (STM) offers exciting new ways of imaging surfaces of biological or organic materials with resolution to the sub-molecular scale. Rigid, conductive surfaces can readily be imaged with the STM with atomic resolution. Unfortunately, organic surfaces are neither sufficiently conductive or rigid enough to be examined directly with the STM. At present, nonconductive surfaces can be examined in two ways: 1) Using the AFM, which measures the deflection of a weak spring as it is dragged across the surface, or 2) coating or replicating non-conductive surfaces with metal layers so as to make them conductive, then imaging with the STM. However, we have found that the conventional freeze-fracture technique, while extremely useful for imaging bulk organic materials with STM, must be modified considerably for optimal use in the STM.


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