Electrochemical and time-of-flight secondary ion mass spectrometry analysis of ultra-thin metal oxide (Al2O3 and Ta2O5) coatings deposited by atomic layer deposition on stainless steel

2011 ◽  
Vol 56 (28) ◽  
pp. 10516-10523 ◽  
Author(s):  
Belén Díaz ◽  
Jolanta Światowska ◽  
Vincent Maurice ◽  
Antoine Seyeux ◽  
Bernard Normand ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Stainless Steel ◽  
Atomic Layer Deposition ◽  
Metal Oxide ◽  
Secondary Ion Mass Spectrometry ◽  
Atomic Layer ◽  
Mass Spectrometry Analysis ◽  
Spectrometry Analysis ◽  
Layer Deposition ◽  
Secondary Ion

Calculation of Membrane Lipid Ratios Using Single-Pixel Time-of-Flight Secondary Ion Mass Spectrometry Analysis

2015 ◽  
Vol 87 (15) ◽  
pp. 7795-7802 ◽  
Author(s):  
Rainer Kassenböhmer ◽  
Felix Draude ◽  
Martin Körsgen ◽  
Andreas Pelster ◽  
Heinrich F. Arlinghaus
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Membrane Lipid ◽  
Mass Spectrometry Analysis ◽  
Spectrometry Analysis ◽  
Lipid Ratios ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Single Pixel
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