Iterative mapping for high-precision calibration and displacement measurements

Optik ◽  
2021 ◽  
pp. 168195
Author(s):  
Cong Liu ◽  
Licheng Wang ◽  
Xiaopeng Liu ◽  
Zhihong Xu
Keyword(s):  
High Precision ◽  
Displacement Measurements

Design of a Constant Probing Force System for Profilometer

2014 ◽  
Vol 511-512 ◽  
pp. 301-306
Author(s):  
Shou Bin Liu ◽  
Zhan Ping Li
Keyword(s):  
High Precision ◽  
Voice Coil Motor ◽  
Experimental Results ◽  
Measuring System ◽  
Core Component ◽  
Force System ◽  
The Core ◽  
Displacement Measurements

The core component of profilometer is a stylus displacement measuring system, whose resolution reaches nanoscale. Since the stylus tip is very small, a variation on probing force has a great impact on the results of high-precision displacement measurements. In this paper, a special flat rectangular voice coil motor is designed to realize a constant probing force for the stylus displacement measuring system. Experimental results show the probing force can be adjusted from 5mg to 1000mg and the resolution can reach 5mg.

Investigation of High-Precision Laser Instrument for Distance and Displacement Measurements

2021 ◽  
Author(s):  
Iurii Minin ◽  
Igor Bulatov ◽  
Nikita Korobov ◽  
Mstislav Dubrov ◽  
Maxim Fedorov
Keyword(s):  
High Precision ◽  
Displacement Measurements

Stage Equipped with Single Actuator for Nano-Positioning in Large Travel Range

2007 ◽  
Vol 364-366 ◽  
pp. 768-772
Author(s):  
Yung Cheng Wang ◽  
Chiun Jie Lin ◽  
Chao Jung Chen ◽  
Huay Chung Liou
Keyword(s):  
High Precision ◽  
Tilt Angle ◽  
Laser Interferometer ◽  
Low Cost ◽  
Positioning System ◽  
Precision Positioning ◽  
Angle Sensor ◽  
Positioning Control ◽  
Increasing Demand ◽  
Displacement Measurements

Precision positioning is an essential basis for precision mechanical engineering, such as positioning for precision manufacture, or positioning control of robot arms. Due to the increasing demand for precision in the submicrometer range, precision positioning plays an important role for precision manufacture. In this investigation a nano-positioning stage is developed. With the positioning system, high precision positioning and large displacement range can be achieved simultaneously. Advantages of this developed system are positioning driver with single actuator, uncomplicated mechanical structure, low cost and lower hardware requirement. A laser interferometer is used for displacement measurements of the translation stage, and a mini-autocollimator serves as angle sensor for tilt angle measurements. The tilt angle can be minimized with piezo translators and control operations. By the displacement measurements of laser interferometer, the feedback control is performed for positioning in large travel range. High precision positioning in nanometer-order can be achieved with the positioning system. With this development, individual sensor modules are self-accomplished and dominating technologies for the complete nano-positioning system are established.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

High precision measurement of the SOS surface thickness in the rough phase

1991 ◽  
Vol 1 (12) ◽  
pp. 1669-1673 ◽  
Author(s):  
Hans Gerd Evertz ◽  
Martin Hasenbusch ◽  
Mihail Marcu ◽  
Klaus Pinn ◽  
Sorin Solomon
Keyword(s):  
High Precision ◽  
Precision Measurement ◽  
High Precision Measurement ◽  
Surface Thickness
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