Tuning tunnel barrier in Si3N4-based resistive memory embedding SiO2 for low-power and high-density cross-point array applications
2016 ◽
Vol 663
◽
pp. 256-261
◽
2020 ◽
Vol 6
(6)
◽
pp. 2000154
◽
Keyword(s):
2017 ◽
Vol E100.C
(3)
◽
pp. 329-339
Keyword(s):