Proton irradiation creep of beta-silicon carbide

2011 ◽  
Vol 418 (1-3) ◽  
pp. 198-206 ◽  
Author(s):  
Vani Shankar ◽  
Gary S. Was
2014 ◽  
Vol 455 (1-3) ◽  
pp. 73-80 ◽  
Author(s):  
T. Koyanagi ◽  
K. Shimoda ◽  
S. Kondo ◽  
T. Hinoki ◽  
K. Ozawa ◽  
...  

2017 ◽  
Vol 897 ◽  
pp. 311-314 ◽  
Author(s):  
Alexander A. Lebedev ◽  
Boris Ya. Ber ◽  
Gagik A. Oganesyan ◽  
Sergey V. Belov ◽  
Natalia. V. Seredova ◽  
...  

Effects of proton irradiation in n-3C-SiC grown by sublimation on a 4H-SiC substrate have been studied by the Hall effect and photoluminescence methods. It was found that the carrier removal rate (Vd) reaches a value of ~110 cm-1. The full compensation of samples with an initial concentration of (1-2) x 1018 cm -3 was estimated to occur at doses of about 6 x 1015 cm -2. Compared with 4H and 6H silicon carbide, no significant increase in the intensity of so-called "defective" photoluminescence was observed in 3C-SiC.


2013 ◽  
Vol 740-742 ◽  
pp. 369-372
Author(s):  
Alexander M. Ivanov ◽  
Alexander A. Lebedev ◽  
V.V. Kozlovski

The irradiation with 0.9 MeV electrons and with 8 MeV and 15 MeV protons were performed for studying radiation defects. Proton scattering in a silicon carbide film has been numerically simulated. Distribution histograms of the energy imparted to recoil atoms are obtained. Two energy ranges are considered when analyzing the histograms. In the first range of “low” energies, individual Frenkel pairs with closely spaced components are created. In the second range, recoil atoms have energies sufficient for generating a cascade of displacements. This gives rise to microscopic regions with high density of vacancies and vacancy complexes of various kinds.


2011 ◽  
Vol 45 (2) ◽  
pp. 141-144 ◽  
Author(s):  
A. M. Ivanov ◽  
V. V. Kozlovski ◽  
N. B. Strokan ◽  
A. A. Lebedev

2015 ◽  
Vol 459 ◽  
pp. 183-193 ◽  
Author(s):  
Cheng Xu ◽  
Gary S. Was

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