Initial oxidation of U3Si2 studied by in-situ XPS analysis

2019 ◽  
Vol 520 ◽  
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Author(s):  
Tingwen Yan ◽  
Donghua Xie ◽  
Zhilei Chen ◽  
Ruilong Yang ◽  
Kangwei Zhu ◽  
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Xps Analysis ◽  
Initial Oxidation ◽  
In Situ Xps

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Max Schütte ◽  
Guillaume Sauthier ◽  
Massimo Tallarida ◽  
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Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
Low Pressure ◽  
Rf Plasma ◽  
Xps Analysis ◽  
Inductively Coupled ◽  
In Situ Xps ◽  
Titanium Thin Films

scholarly journals Effect of heat treatment on the surface chemical structure of glass: Oxygen speciation from in situ XPS analysis

2017 ◽  
Vol 101 (2) ◽  
pp. 644-656 ◽  
Author(s):  
Joy Banerjee ◽  
Vincent Bojan ◽  
Carlo G. Pantano ◽  
Seong H. Kim
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Heat Treatment ◽  
Chemical Structure ◽  
Xps Analysis ◽  
Surface Chemical ◽  
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In situ XPS analysis of the tungsten/sublayer interface after SF6 based reactive ion etching

1993 ◽  
Vol 70-71 ◽  
pp. 613-618 ◽  
Author(s):  
N. Couchman ◽  
C. Pacifico ◽  
G. Turban ◽  
B. Grolleau
Keyword(s):  
Reactive Ion Etching ◽  
Xps Analysis ◽  
Ion Etching ◽  
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Catalyst free growth of high density uniform InN nanocolumns on p-GaAs(001) surface by PA-MBE and their in situ XPS analysis

2015 ◽  
Vol 331 ◽  
pp. 248-253 ◽  
Author(s):  
Qiang Jing ◽  
Hang Yang ◽  
Wancheng Li ◽  
Guoguang Wu ◽  
Yuantao Zhang ◽  
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Keyword(s):  
High Density ◽  
Xps Analysis ◽  
Catalyst Free ◽  
In Situ Xps ◽  
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Vol 426 ◽  
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Author(s):  
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Wiktor Redzynia ◽  
Jacek Tyczkowski
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Xps Analysis ◽  
In Situ Xps

Determination of the stoichiometry and the Yb2+/Yb3+ ratio in YbF x optical IAD films by RBS and in situ XPS analysis

1997 ◽  
Vol 125 (1-4) ◽  
pp. 239-243 ◽  
Author(s):  
A. Schnellb�gel ◽  
B. Selle ◽  
R. Anton
Keyword(s):  
Xps Analysis ◽  
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2019 ◽  
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Yunsong Zhao ◽  
Xueqiao Li ◽  
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Initial Oxidation ◽  
Environmental Tem
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