Interaction of size-selected Ag-clusters on Au-thin films: A composition study with in-situ XPS analysis at an elevated temperature

2021 ◽  
Author(s):  
Pintu Barman ◽  
Anindita Deka ◽  
Satyaranjan Bhattacharyya
Keyword(s):  
Thin Films ◽  
Elevated Temperature ◽  
Xps Analysis ◽  
In Situ Xps ◽  
Ag Clusters ◽  
Composition Study ◽  
Au Thin Films

In situ XPS analysis of the electronic structure of silicon and titanium thin films exposed to low-pressure inductively-coupled RF plasma

2021 ◽  
Vol 542 ◽  
pp. 148684
Author(s):  
Jordi Fraxedas ◽  
Max Schütte ◽  
Guillaume Sauthier ◽  
Massimo Tallarida ◽  
Salvador Ferrer ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
Low Pressure ◽  
Rf Plasma ◽  
Xps Analysis ◽  
Inductively Coupled ◽  
In Situ Xps ◽  
Titanium Thin Films

scholarly journals Effect of heat treatment on the surface chemical structure of glass: Oxygen speciation from in situ XPS analysis

2017 ◽  
Vol 101 (2) ◽  
pp. 644-656 ◽  
Author(s):  
Joy Banerjee ◽  
Vincent Bojan ◽  
Carlo G. Pantano ◽  
Seong H. Kim
Keyword(s):  
Heat Treatment ◽  
Chemical Structure ◽  
Xps Analysis ◽  
Surface Chemical ◽  
In Situ Xps

In-situ elevated temperature imaging of thin films with a microfabricated hot stage for scanning probe microscopes

1999 ◽  
Vol 141 (1-2) ◽  
pp. 119-128 ◽  
Author(s):  
Michael DiBattista ◽  
Sanjay V. Patel ◽  
John F. Mansfield ◽  
Johannes W. Schwank
Keyword(s):  
Thin Films ◽  
Elevated Temperature ◽  
Scanning Probe ◽  
Temperature Imaging

In-situ observation of cooperative grain boundary sliding and migration in the nano-twinned nanocrystalline-Au thin-films

2020 ◽  
Vol 180 ◽  
pp. 97-102 ◽  
Author(s):  
Qizhen Li ◽  
Lihua Wang ◽  
Jiao Teng ◽  
Xiaolu Pang ◽  
Xiaodong Han ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Grain Boundary Sliding ◽  
In Situ Observation ◽  
Boundary Sliding ◽  
Au Thin Films ◽  
And Migration

Inversion of temperature-dependent in situ ellipsometry constants of Au thin films

1997 ◽  
Vol 94-95 ◽  
pp. 368-373 ◽  
Author(s):  
Soonil Lee ◽  
Junegie Hong ◽  
Soo-ghee Oh
Keyword(s):  
Thin Films ◽  
Temperature Dependent ◽  
Au Thin Films

Initial oxidation of U3Si2 studied by in-situ XPS analysis

2019 ◽  
Vol 520 ◽  
pp. 1-5 ◽  
Author(s):  
Tingwen Yan ◽  
Donghua Xie ◽  
Zhilei Chen ◽  
Ruilong Yang ◽  
Kangwei Zhu ◽  
...  
Keyword(s):  
Xps Analysis ◽  
Initial Oxidation ◽  
In Situ Xps

In situ XPS analysis of the tungsten/sublayer interface after SF6 based reactive ion etching

1993 ◽  
Vol 70-71 ◽  
pp. 613-618 ◽  
Author(s):  
N. Couchman ◽  
C. Pacifico ◽  
G. Turban ◽  
B. Grolleau
Keyword(s):  
Reactive Ion Etching ◽  
Xps Analysis ◽  
Ion Etching ◽  
In Situ Xps

In-situ ellipsometric study of growth of Au thin films

1996 ◽  
Author(s):  
Takehisa Shibuya ◽  
Naoji Amano ◽  
Shuichi Kawabata ◽  
Hideshi Yokota
Keyword(s):  
Thin Films ◽  
Ellipsometric Study ◽  
Au Thin Films
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