scholarly journals An approach for wellbore failure analysis using rock cavings and image processing

2018 ◽  
Vol 10 (5) ◽  
pp. 865-878 ◽  
Author(s):  
Christopher Skea ◽  
Alireza Rezagholilou ◽  
Pouria Behnoud Far ◽  
Raoof Gholami ◽  
Mohammad Sarmadivleh
Keyword(s):  
Image Processing ◽  
Failure Analysis ◽  
Wellbore Failure

Extending Acoustic Microscopy for Comprehensive Failure Analysis Applications

2010 ◽  
Author(s):  
Sebastian Brand ◽  
Matthias Petzold ◽  
Peter Czurratis ◽  
Peter Hoffrogge
Keyword(s):  
Image Processing ◽  
Failure Analysis ◽  
Signal Analysis ◽  
Flip Chip ◽  
Fault Isolation ◽  
Acoustic Microscopy ◽  
Specific Information ◽  
Full Potential ◽  
Time Frequency ◽  
Non Destructive

Abstract In industrial manufacturing of microelectronic components, non-destructive failure analysis methods are required for either quality control or for providing a rapid fault isolation and defect localization prior to detailed investigations requiring target preparation. Scanning acoustic microscopy (SAM) is a powerful tool enabling the inspection of internal structures in optically opaque materials non-destructively. In addition, depth specific information can be employed for two- and three-dimensional internal imaging without the need of time consuming tomographic scan procedures. The resolution achievable by acoustic microscopy is depending on parameters of both the test equipment and the sample under investigation. However, if applying acoustic microscopy for pure intensity imaging most of its potential remains unused. The aim of the current work was the development of a comprehensive analysis toolbox for extending the application of SAM by employing its full potential. Thus, typical case examples representing different fields of application were considered ranging from high density interconnect flip-chip devices over wafer-bonded components to solder tape connectors of a photovoltaic (PV) solar panel. The progress achieved during this work can be split into three categories: Signal Analysis and Parametric Imaging (SA-PI), Signal Analysis and Defect Evaluation (SA-DE) and Image Processing and Resolution Enhancement (IP-RE). Data acquisition was performed using a commercially available scanning acoustic microscope equipped with several ultrasonic transducers covering the frequency range from 15 MHz to 175 MHz. The acoustic data recorded were subjected to sophisticated algorithms operating in time-, frequency- and spatial domain for performing signal- and image analysis. In all three of the presented applications acoustic microscopy combined with signal- and image processing algorithms proved to be a powerful tool for non-destructive inspection.

Case Studies of the Use of Image Processing in Metrology and Failure Analysis

2005 ◽  
Author(s):  
Kartik Ramanujachar
Keyword(s):  
Image Processing ◽  
Failure Analysis ◽  
Case Studies ◽  
Nearest Neighbor ◽  
Image Data ◽  
Cumulative Distribution ◽  
Information Theoretic ◽  
Atomic Force ◽  
Processing Techniques

Abstract This paper describes the use of image processing techniques in metrology and failure analysis with the help of three case studies. The first study concerns a technique that significantly automates the process and hence enables both a rapid and accurate extraction of cumulative distribution function for transistor CD through the use of edge detection and quantification of image intensities. The second study is about utilizing a cross correlation algorithm and an appropriately chosen sample and image to estimate the "on image" spatial resolution of an scanning electron microscope. The last case study uses image data acquired with an atomic force microscope. The paper describes how information theoretic concepts like entropy and mutual information combined with image segmentation and nearest neighbor extraction can be used to isolate those regions of the AFM scan that can potentially benefit from further analysis.

scholarly journals Advanced Image Processing Technique for Failure Analysis

2017 ◽  
Vol 4 (4) ◽  
pp. 255-258
Author(s):  
Smt. Maya. V. Lakha ◽  
Dr. S. P. RajaManohar ◽  
Dr. K. ChennaKeshava Reddy ◽  
Dr .Abdul Sattar
Keyword(s):  
Image Processing ◽  
Failure Analysis ◽  
Processing Technique ◽  
Image Processing Technique

Some comments about observations and image processing of comet 29P/Schwassmann-Wachmann 1

1999 ◽  
Vol 173 ◽  
pp. 243-248
Author(s):  
D. Kubáček ◽  
A. Galád ◽  
A. Pravda
Keyword(s):  
Image Processing ◽  
Large Scale ◽  
Harvard College ◽  
Oak Ridge ◽  
Large Scale Structures ◽  
Short Period Comet ◽  
Short Period ◽  
Scale Structures ◽  
Harvard College Observatory ◽  
Period Comet

AbstractUnusual short-period comet 29P/Schwassmann-Wachmann 1 inspired many observers to explain its unpredictable outbursts. In this paper large scale structures and features from the inner part of the coma in time periods around outbursts are studied. CCD images were taken at Whipple Observatory, Mt. Hopkins, in 1989 and at Astronomical Observatory, Modra, from 1995 to 1998. Photographic plates of the comet were taken at Harvard College Observatory, Oak Ridge, from 1974 to 1982. The latter were digitized at first to apply the same techniques of image processing for optimizing the visibility of features in the coma during outbursts. Outbursts and coma structures show various shapes.

Analysis of the 9th November 1990 flare

2000 ◽  
Vol 179 ◽  
pp. 229-232
Author(s):  
Anita Joshi ◽  
Wahab Uddin
Keyword(s):  
Image Processing ◽  
Two Dimensional ◽  
Temporal Behaviour ◽  
Contour Maps ◽  
Dimensional Measurements ◽  
Processing Software ◽  
Image Processing Software

AbstractIn this paper we present complete two-dimensional measurements of the observed brightness of the 9th November 1990Hαflare, using a PDS microdensitometer scanner and image processing software MIDAS. The resulting isophotal contour maps, were used to describe morphological-cum-temporal behaviour of the flare and also the kernels of the flare. Correlation of theHαflare with SXR and MW radiations were also studied.

The 'well-known' theory of electron image formation

1983 ◽  
Vol 41 ◽  
pp. 288-289
Author(s):  
M.A. O'Keefe ◽  
W.O. Saxton
Keyword(s):  
Image Processing ◽  
Image Formation ◽  
Source Profiles ◽  
Electron Image

A recent paper by Kirkland on nonlinear electron image processing, referring to a relatively new textbook, highlights the persistence in the literature of calculations based on incomplete and/or incorrect models of electron imageing, notwithstanding the various papers which have recently pointed out the correct forms of the appropriate equations. Since at least part of the problem can be traced to underlying assumptions about the illumination coherence conditions, we attempt to clarify both the assumptions and the corresponding equations in this paper, illustrating the effects of an incorrect theory by means of images calculated in different ways.The first point to be made clear concerning the illumination coherence conditions is that (except for very thin specimens) it is insufficient simply to know the source profiles present, i.e. the ranges of different directions and energies (focus levels) present in the source; we must also know in general whether the various illumination components are coherent or incoherent with respect to one another.

Recent Applications of High Resolution Electron Microscopy to Crystalline Arrays of Virus Particles

1978 ◽  
Vol 36 (3) ◽  
pp. 470-482 ◽  
Author(s):  
R.W. Horne
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Analytical Techniques ◽  
Staining Technique ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
Full Potential ◽  
Virus Particles ◽  
Resolution Electron ◽  
Wide Range

The technique of surrounding virus particles with a neutralised electron dense stain was described at the Fourth International Congress on Electron Microscopy, Berlin 1958 (see Home & Brenner, 1960, p. 625). For many years the negative staining technique in one form or another, has been applied to a wide range of biological materials. However, the full potential of the method has only recently been explored following the development and applications of optical diffraction and computer image analytical techniques to electron micrographs (cf. De Hosier & Klug, 1968; Markham 1968; Crowther et al., 1970; Home & Markham, 1973; Klug & Berger, 1974; Crowther & Klug, 1975). These image processing procedures have allowed a more precise and quantitative approach to be made concerning the interpretation, measurement and reconstruction of repeating features in certain biological systems.

An Overview of Digital Image Processing and Recognition (Invited Paper)

1982 ◽  
Vol 40 ◽  
pp. 700-702
Author(s):  
R. C. Gonzalez
Keyword(s):  
Image Processing ◽  
New York ◽  
Digital Image Processing ◽  
Digital Image ◽  
Practical Implementation ◽  
Submarine Cable ◽  
Vigorous Growth ◽  
Digitized Pictures ◽  
Processing Techniques ◽  
And Storage

Interest in digital image processing techniques dates back to the early 1920's, when digitized pictures of world news events were first transmitted by submarine cable between New York and London. Applications of digital image processing concepts, however, did not become widespread until the middle 1960's, when third-generation digital computers began to offer the speed and storage capabilities required for practical implementation of image processing algorithms. Since then, this area has experienced vigorous growth, having been a subject of interdisciplinary research in fields ranging from engineering and computer science to biology, chemistry, and medicine.

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