Analyzing the effect of the forces exerted on cantilever probe tip of atomic force microscope with tapering-shaped geometry and double piezoelectric extended layers in the air and liquid environments
2017 ◽
Vol 386
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pp. 251-264
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2007 ◽
Vol 136
(1)
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pp. 95-103
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1997 ◽
Vol 68
(5)
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pp. 2082-2090
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1992 ◽
Vol 50
(2)
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pp. 1146-1147
1989 ◽
Vol 47
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pp. 32-33
1993 ◽
Vol 51
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pp. 704-705
2004 ◽
Vol 28
(3)
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pp. 301-304
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2015 ◽
Vol 6
(3)
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pp. 179-191
Keyword(s):
Keyword(s):