X-ray peak broadening on microstructure, and structural properties of titanium and Ti-6Al-4V alloys

2020 ◽  
Vol 27 ◽  
pp. 2390-2393 ◽  
Author(s):  
Showkat Ali ◽  
R. Karunanithi ◽  
M. Prashanth ◽  
M. Abdur Rahman
2016 ◽  
Vol 6 (6) ◽  
pp. 1264-1268
Author(s):  
F. A. Al-Mufadi ◽  
A. El-Taher ◽  
G. A. Gamal

Indium monoselenide (InSe) which is a layered semiconductor whose energy gap is 1.24 eV has received attention because of its potential applications in optoelectronic devices. In the present work n-type InSe crystals were grown by a special modification of the vertical Bridgman technique. X-ray Diffraction (XRD) patterns showed that all samples were single phased InSe. The crystals were irradiated with 100 - 500 KGy to reveal the influence of irradiation on the structural properties of the samples. Detailed structural analysis was done by Scherrerr’s procedures, x-ray peak broadening and Williamson–Hall plot methods to evaluate the crystalline sizes and lattice strain. Also from the relations between the irradiation dose and the deformation of the lattice parameters we could investigate and discuss the mutation of the dislocation density, grain size, microstrain and crystallinity of the grown crystals. Striking results are found due to irradiation in the present study for the first time.


2021 ◽  
Author(s):  
yingmeng qi ◽  
Qi Han ◽  
li wu ◽  
Jun Li

A series of niobium-containing mesoporous materials Nb-SBA-15 have been prepared by sonication–impregnation and hydrothermal process. The dispersion and structural properties of niobium-containing species were systematically characterized by X-ray diffraction, scanning...


2007 ◽  
Vol 5 (1) ◽  
pp. 169-176 ◽  
Author(s):  
Abdülhadi Baykal ◽  
Yüksel Köseoğlu ◽  
Mehmet Şenel

AbstractHeating hydrous manganese (II) hydroxide gel at 85 °C for 12 hours produces Mn3O4 nanoparticles. They were characterized by X-ray powder diffraction (XRD) and infrared spectroscopy (FTIR). The particle size estimated from the SEM and X-ray peak broadening is approximately 32 nm, showing them to be nanocrystalline. EPR measurements confirm a typical Mn2+signal with a highly resolved hyperfine structure.


In this paper we report single crystal X-ray diffraction studies of urea inclusion compounds containing diacyl peroxides (dioctanoyl peroxide (OP), diundecanoyl peroxide (UP), lauroyl peroxide (LP)) as the guest component. In these inclusion compounds, the host (urea) molecules crystallize in a hexagonal structure that contains linear, parallel, non-intersecting channels (tunnels). The guest (diacyl peroxide) molecules are closely packed inside these channels with a periodic repeat distance that is incommensurate with the period of the host structure along the channel axis. Furthermore, there is pronounced inhomogeneity within the guest structure: within each single crystal, there are regions in which the guest molecules are three-dimensionally ordered, and other regions in which they are only one-dimensionally ordered (along the channel axis). Although it has not proven possible to ‘determine’ the guest structures in the conventional sense, substantial information concerning their average periodicities and their orientational relationships with respect to the host has been deduced from single crystal X-ray diffraction photographs recorded at room temperature. For OP/urea, UP/urea and LP/urea, the guest structure in the three-dimensionally ordered regions is monoclinic, and six types of domain of this monoclinic structure can be identified within each single crystal. The relative packing of diacyl peroxide molecules is the same in each domain, and the different domains are related by 60° rotation about the channel axis. For each of these inclusion compounds, the offset between the ‘heights’ of the guest molecules in adjacent channels is the same ( ca . 4.6 Å (4.6 x 10 -10 m)) within experimental error, suggesting that the relative interchannel packing of the guest molecules is controlled by a property of the diacyl peroxide group. In addition to revealing these novel structural properties, the work discussed in this paper has more general relevance concerning the measurement and interpretation of single crystal X-ray diffraction patterns that are based on more than one three-dimensionally periodic reciprocal lattice. Seven separate reciprocal lattices are required to rationalize the complete X-ray diffraction pattern from each diacyl peroxide/urea crystal studied here.


2014 ◽  
Vol 783-786 ◽  
pp. 1426-1431
Author(s):  
Wang Ryeol Kim ◽  
Min Chul Kwon ◽  
Jung Hoon Lee ◽  
Uoo Chang Jung ◽  
Won Sub Chung

TiAlSiN coatings were deposited on WC-Co metal by using a cathodic arc ion deposition method of cylindrical cathode. We used Ti / Al (50 / 50 at.%) arc target and silicon sputter target. The influence of the nitrogen pressure, TiAl cathode arc current, bias voltage, and deposition temperature on the mechanical and the structural properties of the films were investigated. The structural features of the films were investigation in detail using X-ray diffraction. And coatings were characterized by means of FE-SEM, nanoindentation, Scratch tester, Tribology tester, XRD and XPS. The hardness of the film reached 43 GPa at the cathode arc current of 230 A and decreased with a further increase of the arc current. And the adhesion of the film reached 34 N. The results showed that the TiAlSiN coating exhibited an excellent mechanical properties which application for tools and molds.


1988 ◽  
Vol 66 (5) ◽  
pp. 373-375 ◽  
Author(s):  
C. J. Arsenault ◽  
D. E. Brodie

Zn-rich and P-rich amorphous Zn3P2 thin films were prepared by co-evaporation of the excess element during the normal Zn3P2 deposition. X-ray diffraction techniques were used to investigate the structural properties and the crystallization process. Agglomeration of the excess element within the as-made amorphous Zn3P2 thin film accounted for the structural properties observed after annealing the sample. Electrical measurements showed that excess Zn reduces the conductivity activation energy and increases the conductivity, while excess P up to 15 at.% does not alter the electrical properties significantly.


1996 ◽  
Vol 69 (2) ◽  
pp. 194-196 ◽  
Author(s):  
T. R. Thurston ◽  
N. M. Jisrawi ◽  
S. Mukerjee ◽  
X. Q. Yang ◽  
J. McBreen ◽  
...  

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