Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress

2014 ◽  
Vol 54 (9-10) ◽  
pp. 2164-2166 ◽  
Author(s):  
Jung Han Kang ◽  
Edward Namkyu Cho ◽  
Ilgu Yun
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Drain Current ◽  
Current Stress ◽  
Amorphous Ingazno

Analytical surface-potential-based drain current model for amorphous InGaZnO thin film transistors

2013 ◽  
Vol 114 (18) ◽  
pp. 184502 ◽  
Author(s):  
A. Tsormpatzoglou ◽  
N. A. Hastas ◽  
N. Choi ◽  
F. Mahmoudabadi ◽  
M. K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Potential ◽  
Thin Film Transistors ◽  
Current Model ◽  
Drain Current ◽  
Amorphous Ingazno

scholarly journals Gate voltage and drain current stress instabilities in amorphous In–Ga–Zn–O thin-film transistors with an asymmetric graphene electrode

AIP Advances ◽  
2015 ◽  
Vol 5 (9) ◽  
pp. 097141 ◽  
Author(s):  
Joonwoo Kim ◽  
Sung Myung ◽  
Hee-Yeon Noh ◽  
Soon Moon Jeong ◽  
Jaewook Jeong
Keyword(s):  
Thin Film ◽  
Gate Voltage ◽  
Thin Film Transistors ◽  
Drain Current ◽  
Current Stress ◽  
Graphene Electrode

Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements

2013 ◽  
Vol 34 (11) ◽  
pp. 1403-1405 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Forough Mahmoudabadi ◽  
Nackbong Choi ◽  
Miltiadis K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
High Current ◽  
Low Frequency Noise ◽  
Current Stress ◽  
Noise Measurements ◽  
Amorphous Ingazno

Investigation on mechanism for instability under drain current stress in amorphous Si–In–Zn–O thin-film transistors

2013 ◽  
Vol 527 ◽  
pp. 314-317 ◽  
Author(s):  
Do Hyung Kim ◽  
Hyun Kwang Jung ◽  
Woochul Yang ◽  
Dae Hwan Kim ◽  
Sang Yeol Lee
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Drain Current ◽  
Current Stress ◽  
Amorphous Si

Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

2011 ◽  
Vol 32 (11) ◽  
pp. 1546-1548 ◽  
Author(s):  
Minkyung Bae ◽  
Yongsik Kim ◽  
Dongsik Kong ◽  
Hyun Kwang Jeong ◽  
Woojoon Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Carrier Density ◽  
Drain Current ◽  
Analytical Models ◽  
Gate Capacitance ◽  
Amorphous Ingazno ◽  
Effective Carrier
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