Drain Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors with Different Active Layer Thicknesses
2018 ◽
Vol 11
(4)
◽
pp. 559
◽
Dapeng Wang
◽
Wenjing Zhao
◽
Hua Li
◽
Mamoru Furuta
2014 ◽
Vol 54
(9-10)
◽
pp. 2164-2166
◽
Jung Han Kang
◽
Edward Namkyu Cho
◽
Ilgu Yun
2013 ◽
Vol 114
(18)
◽
pp. 184502
◽
A. Tsormpatzoglou
◽
N. A. Hastas
◽
N. Choi
◽
F. Mahmoudabadi
◽
M. K. Hatalis
◽
...
2018 ◽
Vol 141
◽
pp. 23-30
◽
2015 ◽
Vol 5
(9)
◽
pp. 097141
◽
Joonwoo Kim
◽
Sung Myung
◽
Hee-Yeon Noh
◽
Soon Moon Jeong
◽
Jaewook Jeong
2017 ◽
Vol 64
(9)
◽
pp. 3654-3660
◽
Hongyu He
◽
Yuan Liu
◽
Binghui Yan
◽
Xinnan Lin
◽
Xueren Zheng
◽
...
2013 ◽
Vol 34
(11)
◽
pp. 1403-1405
◽
Andreas Tsormpatzoglou
◽
Nikolaos A. Hastas
◽
Forough Mahmoudabadi
◽
Nackbong Choi
◽
Miltiadis K. Hatalis
◽
...
J. H. Kang
◽
E. N. Cho
◽
I. Yun
2013 ◽
Vol 527
◽
pp. 314-317
◽
Do Hyung Kim
◽
Hyun Kwang Jung
◽
Woochul Yang
◽
Dae Hwan Kim
◽
Sang Yeol Lee
2014 ◽
Vol 61
(9)
◽
pp. 3199-3205
◽
Mallory Mativenga
◽
Su Hwa Ha
◽
Di Geng
◽
Dong Han Kang
◽
Ravi K. Mruthyunjaya
◽
...
2014 ◽
Vol 116
(21)
◽
pp. 214504
◽
Thanh Thuy Trinh
◽
Kyungsoo Jang
◽
Vinh Ai Dao
◽
Junsin Yi