A closed-form trapped-charge-included drain current compact model for amorphous oxide semiconductor thin-film transistors

2018 ◽  
Vol 91 ◽  
pp. 307-312 ◽  
Author(s):  
Fei Yu ◽  
Chuanzhong Xu ◽  
Gongyi Huang ◽  
Wei Lin ◽  
Tsair-Chun Liang
Keyword(s):  
Thin Film ◽  
Closed Form ◽  
Thin Film Transistors ◽  
Drain Current ◽  
Compact Model ◽  
Oxide Semiconductor ◽  
Amorphous Oxide ◽  
Amorphous Oxide Semiconductor ◽  
Semiconductor Thin Film ◽  
Trapped Charge

Compositional influence on sol-gel-derived amorphous oxide semiconductor thin film transistors

2009 ◽  
Vol 95 (10) ◽  
pp. 103501 ◽  
Author(s):  
Dongjo Kim ◽  
Chang Young Koo ◽  
Keunkyu Song ◽  
Youngmin Jeong ◽  
Jooho Moon
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Sol Gel ◽  
Oxide Semiconductor ◽  
Amorphous Oxide ◽  
Amorphous Oxide Semiconductor ◽  
Semiconductor Thin Film
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