In-situ composite Nb-Si alloys have been studied by several investigators as potential high temperature structural materials. The two major processing routes used to fabricate these composites are directional solidification and extrusion of arc-cast solidified ingots. In both cases a stable microstructure of primary Nb dendrites in a eutectoid of Nb and Nb5Si3 phases is developed after heat treatment. The Nb5Si3 phase is stable at room temperature and forms as a decomposition product of the high temperature Nb3Si phase. The anisotropic microstructures developed by both directional solidification and extrusion require evaluation of the texture to fully interpret the fracture and other orientation dependent mechanical behavior of these composites.In this paper we report on the microstructural characterization of a directionally solidified (DS) and heat treated Nb-16 at.%Si alloy. The microtexture of each of the phases (Nb, Nb5Si3) was determined using the Electron BackScattering Pattern (EBSP) technique for electron diffraction in the scanning electron microscope. A system employing automatic diffraction pattern recognition, crystallographic analysis, and sample or beam scanning was used to acquire the microtexture data.