Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials
2018 ◽
Vol 86
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pp. 151-156
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2014 ◽
Vol 46
(7)
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pp. 538-545
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2009 ◽
Vol 80
(4)
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pp. 046107
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2013 ◽
Vol 58
(1)
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pp. 217-222
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1991 ◽
Vol 49
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pp. 836-837
2019 ◽
Vol 21
(15)
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pp. 7989-7995
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2019 ◽
Vol 4
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pp. 1150-1157
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