Single-exposure modulation-based structured illumination microscopy using spatial area phase-shift

2022 ◽  
Vol 150 ◽  
pp. 106855
Author(s):  
Zhongye Xie ◽  
Yan Tang ◽  
Qinyuan Deng ◽  
Jinghua Sun ◽  
Yu He ◽  
...  
PLoS ONE ◽  
2019 ◽  
Vol 14 (8) ◽  
pp. e0221254
Author(s):  
Jorge Sola-Pikabea ◽  
Arcadi Garcia-Rius ◽  
Genaro Saavedra ◽  
Jorge Garcia-Sucerquia ◽  
Manuel Martínez-Corral ◽  
...  

Methods ◽  
2015 ◽  
Vol 75 ◽  
pp. 61-68 ◽  
Author(s):  
Laure-Anne Ligeon ◽  
Nicolas Barois ◽  
Elisabeth Werkmeister ◽  
Antonino Bongiovanni ◽  
Frank Lafont

ACS Photonics ◽  
2021 ◽  
Author(s):  
Alice Sandmeyer ◽  
Mario Lachetta ◽  
Hauke Sandmeyer ◽  
Wolfgang Hübner ◽  
Thomas Huser ◽  
...  

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Karin Legerstee ◽  
Tsion E. Abraham ◽  
Wiggert A. van Cappellen ◽  
Alex L. Nigg ◽  
Johan A. Slotman ◽  
...  

AbstractFocal adhesions (FAs) are flat elongated structures that mediate cell migration and link the cytoskeleton to the extracellular matrix. Along the vertical axis FAs were shown to be composed of three layers. We used structured illumination microscopy to examine the longitudinal distribution of four hallmark FA proteins, which we also used as markers for these layers. At the FA ends pointing towards the adherent membrane edge (heads), bottom layer protein paxillin protruded, while at the opposite ends (tails) intermediate layer protein vinculin and top layer proteins zyxin and VASP extended further. At the tail tips, only intermediate layer protein vinculin protruded. Importantly, head and tail compositions were altered during HGF-induced scattering with paxillin heads being shorter and zyxin tails longer. Additionally, FAs at protruding or retracting membrane edges had longer paxillin heads than FAs at static edges. These data suggest that redistribution of FA-proteins with respect to each other along FAs is involved in cell movement.


2021 ◽  
Vol 11 (7) ◽  
pp. 3023
Author(s):  
Kejun Yang ◽  
Chenhaolei Han ◽  
Jinhua Feng ◽  
Yan Tang ◽  
Zhongye Xie ◽  
...  

The surface and thickness distribution measurement for transparent film is of interest for electronics and packaging materials. Structured illumination microscopy (SIM) is a prospective technique for measuring film due to its high accuracy and efficiency. However, when the distance between adjacent layers becomes close, the peaks of the modulation depth response (MDR) start to overlap and interfere with the peak extraction, which restricts SIM development in the field of film measurement. In this paper, an iterative peak separation algorithm is creatively applied in the SIM-based technique, providing a precise peak identification even as the MDR peaks overlap and bend into one. Compared with the traditional method, the proposed method has a lower detection threshold for thickness. The experiments and theoretical analysis are elaborated to demonstrate the feasibility of the mentioned method.


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