An accurate simulation study on capacitance-voltage characteristics of metal-oxide-semiconductor field-effect transistors in novel structures
2017 ◽
Vol 521
◽
pp. 305-311
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2010 ◽
Vol 28
(1)
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pp. C1G12-C1G17
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2011 ◽
Vol 50
(4)
◽
pp. 04DC11
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2014 ◽
Vol 61
(3)
◽
pp. 734-741
◽
2018 ◽
Vol 57
(6S1)
◽
pp. 06HD03
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